Zobrazeno 1 - 10 of 19 pro vyhledávání: '"Arthur Beckers"'
1
Akademický článek
Semi-Automatic Locating of Cryptographic Operations in Side-Channel Traces
Autor: Jens Trautmann, Arthur Beckers, Lennert Wouters, Stefan Wildermann, Ingrid Verbauwhede, Jürgen Teich
Publikováno v: Transactions on Cryptographic Hardware and Embedded Systems, Vol 2022, Iss 1 (2021)
Locating a cryptographic operation in a side-channel trace, i.e. finding out where it is in the time domain, without having a template, can be a tedious task even for unprotected implementations. The sheer amount of data can be overwhelming. In a sim
Externí odkaz: https://doaj.org/article/05196398c9a2470ba65a73ade5478921
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2
(Adversarial) Electromagnetic Disturbance in the Industry
Autor: Arthur Beckers, Sylvain Guilley, Philippe Maurine, Colin O'Flynn, Stjepan Picek
Publikováno v: IEEE Transactions on Computers, 72, 414-422
IEEE Transactions on Computers, 72, 2, pp. 414-422
Contains fulltext : 290093.pdf (Publisher’s version ) (Closed access) Contains fulltext : 290093.pdf (Author’s version preprint ) (Open Access)
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5cf91489f9ae6205ed12208b8c4b625b
https://hdl.handle.net/2066/290604
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3
Provable Secure Software Masking in the Real-World
Autor: Arthur Beckers, Lennert Wouters, Benedikt Gierlichs, Bart Preneel, Ingrid Verbauwhede
Publikováno v: Constructive Side-Channel Analysis and Secure Design ISBN: 9783030997656
ispartof: pages:215-235 ispartof: CONSTRUCTIVE SIDE-CHANNEL ANALYSIS AND SECURE DESIGN, COSADE 2022 vol:13211 pages:215-235 ispartof: 13th International Workshop on Constructive Side-Channel Analysis and Secure Design (COSADE) location:BELGIUM, Leuve
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ef82ce55a3a1fd88045a68fc6bfafefa
https://doi.org/10.1007/978-3-030-99766-3_10
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4
A Study on Output Bit Tampering of True Random Number Generators Using Time-Varying EM Waves
Autor: Ingrid Verbauwhede, Arthur Beckers, Saki Osuka, Daisuke Fujimoto, Benedikt Gierlichs, Yu-ichi Hayashi
True random number generators (TRNGs) based on ring oscillators are employed in many devices because they can be constructed with logic gates only. If the randomness is degraded by the attack, it may affect the security of the cryptographic protocol.
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::370ff4e8cca2fd4e23f18f8a6587b320
https://lirias.kuleuven.be/handle/20.500.12942/692678
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5
Semi-Automatic Locating of Cryptographic Operations in Side-Channel Traces
Autor: Lennert Wouters, Jens Trautmann, Ingrid Verbauwhede, Arthur Beckers, Stefan Wildermann, Jürgen Teich
Publikováno v: Transactions on Cryptographic Hardware and Embedded Systems, Vol 2022, Iss 1 (2021)
IACR Transactions on Cryptographic Hardware and Embedded Systems
Locating a cryptographic operation in a side-channel trace, i.e. finding out where it is in the time domain, without having a template, can be a tedious task even for unprotected implementations. The sheer amount of data can be overwhelming. In a sim
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c7aa2f7de8052c5867ee4254ba5b3993
https://tches.iacr.org/index.php/TCHES/article/view/9300
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7
Recent progress and future trends in MOCVD growth technology for light emitting diodes
Autor: Adam R. Boyd, Michael Heuken, Arthur Beckers, A. Alam, Hassan Larhrib
Publikováno v: Light-Emitting Devices, Materials, and Applications XXV.
To enable LED technology we developed the MOCVD technology for III-As/P/N based structures in reactors ranging from small scale to large production scale Planetary Reactors. The closed coupled showerhead reactor series (CCS reactor) and the Planetary
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::a89b70689b56e000dd2bd7df17987422
https://doi.org/10.1117/12.2575628
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8
Design and Evaluation of a Spark Gap Based EM-fault Injection Setup
Autor: Josep Balasch, Arthur Beckers, Yu-ichi Hayashi, Masahiro Kinugawa, Ingrid Verbauwhede
The rapid and widespread deployment of electronic devices operating in the field is bringing security issues into the spotlight. Fault injection, for instance, is a class of attacks that allows adversaries to bypass security-related capabilities by t
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5e9e753d2d7864c338e2b713c44fff46
https://lirias.kuleuven.be/handle/123456789/667269
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10
Characterization of EM faults on ATmega328p
Autor: Arthur Beckers, Yu-ichi Hayashi, Josep Balasch, Daisuke Fujimoto, Benedikt Gierlichs, Masahiro Kinugawa, Ingrid Verbauwhede, Saki Osuka
Publikováno v: 2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC)
ispartof: 2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC) ispartof: 2019 Joint International Symposium on Electromagnetic Compa
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2cf911530c346f8689bc7015b7d453a1
https://doi.org/10.23919/emcsapporo/apemc44270.2019.9320849
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