Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Artem A. Tsirkov"'
Autor:
Roman K. Mozhaev, Alexander A. Pechenkin, Artem A. Tsirkov, Kirill G. Belozerov, Vladislav P. Lukashin, Arseniy A. Baluev
Publikováno v:
Безопасность информационных технологий, Vol 30, Iss 4, Pp 150-161 (2023)
Machine vision is a field of artificial intelligence that deals with processing images and videos using special algorithms. This allows devices to analyze visual information. Machine vision helps with tasks such as pattern recognition, image segmenta
Externí odkaz:
https://doaj.org/article/4416d677a6cc4ed0b4d8964a48b9290a
Autor:
Artem N. Tsirkov
Publikováno v:
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::15837fa00d988a2d8b5881b9c78ab3f3
https://doi.org/10.1109/mwent55238.2022.9802407
https://doi.org/10.1109/mwent55238.2022.9802407
Autor:
Artem N. Tsirkov, V.P. Lukashin, Alexander A. Novikov, Alexander A. Pechenkin, A.R. Gritsaenko
Publikováno v:
Problems of advanced micro- and nanoelectronic systems development. :231-235
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5ba890f2b54e1b1dbcca6fe731fc6700
https://doi.org/10.31114/2078-7707-2020-4-231-235
https://doi.org/10.31114/2078-7707-2020-4-231-235
Publikováno v:
2021 International Siberian Conference on Control and Communications (SIBCON).
a division of labor plays significant role in the efficiency of laser SEE Testing. The highest efficiency can be achieved when testers fulfill their roles in a global task: one is engaged in debugging and monitoring the testing progress at the facili
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::22eddb286ebbffe6c66e66b4e54ec541
https://doi.org/10.1109/sibcon50419.2021.9438870
https://doi.org/10.1109/sibcon50419.2021.9438870
Autor:
Georgy S. Sorokoumov, Artem N. Tsirkov, Alexander A. Pechenkin, Dmitriy V. Bobrovsky, Alexander I. Chumakov
Publikováno v:
2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
Experimental results are presented for different CMOS ICs, evidencing latent damage induced by single event latch-up. Additive and non-additive destructive effects are analyzed.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8f143dae580254f53d6297c5d7c68c97
https://doi.org/10.1109/radecs45761.2018.9328692
https://doi.org/10.1109/radecs45761.2018.9328692
Autor:
M.P. Belova, Alexander I. Chumakov, Alexander A. Novikov, Alexander A. Pechenkin, Artem N. Tsirkov
Publikováno v:
2017 IEEE 30th International Conference on Microelectronics (MIEL).
Investigation of total ionizing dose influence on the main single event effect types are presented. The devices under test are ADUM1200 (SEL), 8-bit shift register (SEL), SRAMs K6R4016C1D and K6R4016V1D (SEL, SEU), ATMEGA128 (SEL, SEU), LM124 (SET) a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4bcc36a17af7bb45e864ed1e86e420ae
https://doi.org/10.1109/miel.2017.8190128
https://doi.org/10.1109/miel.2017.8190128