Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Artak Hayrapetyan"'
Autor:
V.Sh. Melikyan, Zaven M. Avetisyan, A.Kh. Mkhitaryan, Synopsys Armenia Cjsc, Artur A. Petrosyan, A.E. Mkrtchyan, Artak Hayrapetyan
Publikováno v:
Problems of advanced micro- and nanoelectronic systems development. :76-81
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6ab666250d624117ec152b83c440c31b
https://doi.org/10.31114/2078-7707-2018-4-76-81
https://doi.org/10.31114/2078-7707-2018-4-76-81
Autor:
V.Sh. Melikyan, Zaven M. Avetisyan, A.E. Mkrtchyan, Aristakes Hovsepyan, A.Kh. Mkhitaryan, Artur A. Petrosyan, Synopsys Armenia Cjsc, Artak Hayrapetyan
Publikováno v:
Problems of advanced micro- and nanoelectronic systems development. :63-68
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ef46bf685635a84afac15ed6f23bc5d
https://doi.org/10.31114/2078-7707-2018-1-63-68
https://doi.org/10.31114/2078-7707-2018-1-63-68
Publikováno v:
Ninth International Conference on Computer Science and Information Technologies Revised Selected Papers.
A method of NMOS and PMOS transistor resistance variation detection and compensation, using reference clock frequency is presented. The proposed method provides opportunity to measure and compensate MOS device resistance deviation, due to technology
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4e9d2fc0359e470a2948881f9889da8a
https://doi.org/10.1109/csitechnol.2013.6710330
https://doi.org/10.1109/csitechnol.2013.6710330
Publikováno v:
2013 IEEE XXXIII International Scientific Conference Electronics and Nanotechnology (ELNANO).
A method of receiver and transmitter input/output resistance calibration, using external reference resistor is presented in this paper. The proposed architecture produces a calibration code corresponding to 50-Ohm PVT compensated termination impedanc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::87fbf74cb2b33e3d71e743b516b30483
https://doi.org/10.1109/elnano.2013.6552085
https://doi.org/10.1109/elnano.2013.6552085