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pro vyhledávání: '"Art Gautesen"'
Autor:
M. Darmon, S. Chatillon, S. Mahaut, L. J. Fradkin, Art Gautesen, Donald O. Thompson, Dale E. Chimenti
Publikováno v:
AIP Conference Proceedings.
The TOFD (Time of Flight Diffraction) Technique is commonly used to detect and to characterize embedded disoriented flaws using their edge diffraction echoes. We present a TOFD simulation module which includes GTD coefficients allowing to predict dif