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Determination of organic contaminant concentration on the silica surface by lateral force microscopy
Publikováno v:
Computer Optics. 40:837-843
We present a method for determining the concentration of organic contaminants on the silica surface by using lateral force maps and surface topology images obtained with scanning probe microscopy. In this study, we optimized the scanning frequency to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8b4391ce8ce6ebef68c195268b267783
https://doi.org/10.18287/2412-6179-2016-40-6-837-843
https://doi.org/10.18287/2412-6179-2016-40-6-837-843
