Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Arnaud Lepert"'
Autor:
Freedom Acquisition I Corp.
Publikováno v:
Business Wire (English). 06/28/2023.
Autor:
Elmar Lohmüller, Puzant Baliozian, Leon Gutmann, Leander Kniffki, Armin Richter, Lili Wang, Ricky Dunbar, Arnaud Lepert, Jonas D. Huyeng, Ralf Preu
Publikováno v:
Progress in Photovoltaics: Research and Applications.
Autor:
Arnaud Lepert, John P. Charles, Yanbo Bai, Christian Scholz, Eli Weiss, Patrick Hyland, Juan Chilla, Jeffrey Wisdom, Zuntu Xu, Yong Lin
Publikováno v:
Vertical External Cavity Surface Emitting Lasers (VECSELs) VI.
Optically pumped semiconductor lasers (OPSL) offer the advantage of excellent beam quality, wavelength agility, and high power scaling capability. In this talk we will present our recent progress of high-power, 920nm OPSLs frequency doubled to 460nm
Autor:
Arnaud Lepert, Matthias Schulze
Publikováno v:
Optik & Photonik. 4:29-32
Flow cytometry is a widely used tool for counting and/or sorting cells in both clinical and research medical applications, as well as animal husbandry and testing of genetically modified organisms. One important cytometry trend is the use of more las
Publikováno v:
Scopus-Elsevier
In this work we report, for the first time, a comparative experimental study of dopant loss from heavily doped polycrystalline silicon (polysilicon) into overlying titanium silicide due to postsilicidation heat-treatments. The experimental study exam
Publikováno v:
SPIE Proceedings.
We present laser results of OPS structures based on highly strained InGaAs quantum wells emitting at 1178nm and frequency doubled to produce high power, high beam quality laser radiation at 589nm. The laser architecture is the same as in our commerci
Autor:
M. Venkatesan, C. Leveugle, S. Moran, Arnaud Lepert, Alex Kalnitsky, Paul K. Hurley, Alan Mathewson, Israel Beinglass, E. Sheehan
Publikováno v:
Scopus-Elsevier
In this work, new observations noted in the capacitance-voltage (CV) behaviour of polysilicon/oxide/silicon capacitor structures are reported. As the doping concentration in the polysilicon layer is reduced, anomalous CV characteristics are observed,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::69f558c268a38af38956f2ed38a65558
http://www.scopus.com/inward/record.url?eid=2-s2.0-0031150255&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-0031150255&partnerID=MN8TOARS
Autor:
Lohmüller, Elmar, Baliozian, Puzant, Gutmann, Leon, Kniffki, Leander, Richter, Armin, Wang, Lili, Dunbar, Ricky, Lepert, Arnaud, Huyeng, Jonas D., Preu, Ralf
Publikováno v:
Progress in Photovoltaics; Jul2023, Vol. 31 Issue 7, p729-737, 9p
Autor:
Xiaolong Hu xlhu@umich.edu, Berggren, Karl K. berggren@mit.edu
Publikováno v:
Laser Focus World. Jan2012, Vol. 48 Issue 1, p109-112. 4p.
Publikováno v:
Laser Focus World. Jan2012, Vol. 48 Issue 1, p75-79. 5p.