Autonomous Integration of TSN-unaware Applications with QoS Requirements in TSN Networks

Autor: Flüchter, Moritz, Lindner, Steffen, Osswald, Lukas, Arnaud, Jérôme, Menth, Michael

Modern industrial networks transport both best-effort and real-time traffic. Time-Sensitive Networking (TSN) was introduced by the IEEE TSN Task Group as an enhancement to Ethernet to provide high quality of service (QoS) for real-time traffic. In a

Externí odkaz: http://arxiv.org/abs/2402.16454

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Characterization of subnanometric layers by grazing incidence X-ray reflectometry

Autor: B. Emprin, Pascal Mercère, F. Delmotte, P.-H. Stemmler, Evgueni Meltchakov, P. Troussel, G. Soullié, Arnaud Jérôme

Publikováno v: Thin Solid Films
Thin Solid Films, Elsevier, 2014, 556, pp.54-60. ⟨10.1016/j.tsf.2014.01.001⟩
Thin Solid Films, 2014, 556, pp.54-60. ⟨10.1016/j.tsf.2014.01.001⟩

International audience; We present a method to characterize subnanometric layers based on grazing incidence X-ray reflectometry. For this purpose, we propose to use a “Fabry–Pérot” type multilayer structure in order to improve the sensitivity

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::47608fd67948c646a9a7e76eca2810f7
https://doi.org/10.1016/j.tsf.2014.01.001

Multilayer optics for coherent EUV/X-ray laser sources

Autor: Ch. Bourassin-Bouchet, S. de Rossi, F. Delmotte, Arnaud Jérôme, Françoise Varniere, Evgueni Meltchakov, M. Dehlinger

Publikováno v: Proc. SPIE
SPIE Optical Engineering + Applications, X-Ray Lasers and Coherent X-Ray Sources: Development and Applications XI
SPIE Optical Engineering + Applications, X-Ray Lasers and Coherent X-Ray Sources: Development and Applications XI, Aug 2015, San Diego, United States. pp.958907, ⟨10.1117/12.2188048⟩

International audience; After a brief review of recent results achieved at Laboratoire Charles Fabry concerning high reflectivity mirrors, mirrors with enhanced spectral purity and broadband mirrors, we describe a new approach to design high efficien

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d69e419f29d205072f7692fec8b7eb86
https://doi.org/10.1117/12.2188048

La/B4C small period multilayer interferential mirror for the analysis of boron

Autor: Françoise Bridou, Arnaud Jérôme, Philippe Jonnard, Jean-Michel André, C. Michaelsen, Franck Delmotte, Marie-Françoise Ravet, Elena O. Filatova, J. Wiesmann

Publikováno v: X-Ray Spectrometry
X-Ray Spectrometry, Wiley, 2005, 34 (3), pp.203-206
X-Ray Spectrometry, Wiley, 2004, 34 (3), pp.203-206. ⟨10.1002/xrs.793⟩
X-Ray Spectrometry, 2004, 34 (3), pp.203-206. ⟨10.1002/xrs.793⟩
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This work was partly carried out at BESSY II in the framework of the project BESSY Number HPP33/150902 and supported by the European Commission under the ‘Human Potential Programme, Transnational Access to Major Research Infrastructures’, Contrac

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a2c0f90d0812679d268f7131cb5cb181
https://doi.org/10.1002/xrs.793