Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Arnaud, Bousquet"'
Autor:
Arnaud Bousquet
Publikováno v:
Field Actions Science Reports, Vol 23, Pp 88-89 (2021)
Externí odkaz:
https://doaj.org/article/9aa12e4be6854864a0b0b5800c4a3606
Autor:
Tanya Schaeffer, Lucile C. Teague Sheridan, Arnaud Bousquet, Liang-Shan Chen, Bianzhu Fu, Lowell Hodgkins, Chongkhiam Oh
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper highlights the application of nanoprobing technique and electron tomography analysis to characterize the tiny gate oxide pinhole defect in NMOS FinFET devices. Nanoprobing technique was utilized to achieve a better understanding on the fai
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fdbfa77161dd335d72030f2753634140
https://doi.org/10.31399/asm.cp.istfa2017p0451
https://doi.org/10.31399/asm.cp.istfa2017p0451
Publikováno v:
La psychiatrie de l'enfant. 49:513-541
La depression du postpartum (DPP) peut avoir des consequences deleteres sur la mere, le developpement de l’enfant, et sur la relation mere/enfant. Afin d’eviter l’installation de cet etat depressif qui n’est souvent pas reconnu par la mere ni
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1bab2e7e3636894174d262b95ea48469
https://doi.org/10.3917/psye.492.0513
https://doi.org/10.3917/psye.492.0513
Publikováno v:
IRPS
This paper presents the impact of wafer thinning process on GLOBALFOUNDRIES high-k metal gate CMOS wafers with TSV. The initial study of wafer backside surface finish and thickness was performed on non-TSV wafers, and the impact on active devices suc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a33002b0fcd2bd5ab57e18db01154245
https://doi.org/10.1109/irps.2015.7112735
https://doi.org/10.1109/irps.2015.7112735
Publikováno v:
Journal of Affective Disorders. 70:291-306
Background : This paper is part of a prospective, epidemiologic study concerning postpartum depression (PPD). The women were first examined during pregnancy; after delivery they were seen with their infants at 3 and 18 months. The present study focus
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9fa76a6d326274843556f43935576950
https://doi.org/10.1016/s0165-0327(01)00367-6
https://doi.org/10.1016/s0165-0327(01)00367-6
Publikováno v:
Crisis. 20:28-35
The high mortality rate among drug users, which is partly due to the HIV epidemic and partly due to drug-related accidental deaths and suicides, presents a major public health problem. Knowing more about prevalence, incidence, and risk factors is imp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bed35df84613fc300f440e6b4a42c6dc
https://doi.org/10.1027//0227-5910.20.1.28
https://doi.org/10.1027//0227-5910.20.1.28
Publikováno v:
European childadolescent psychiatry. 12(2)
Background: Postpartum depression (PPD) is known to have important negative effects on mother, infant and mother-child relationship. Methods: We present a case-control study of 35 mothers and their 18-month-old infants. These mothers suffered from po
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::39e9597032126e6a41f60d6338d27869
https://pubmed.ncbi.nlm.nih.gov/12664271
https://pubmed.ncbi.nlm.nih.gov/12664271
Autor:
Christine, Bouchardy, Georges, Schüler, Christoph, Minder, Philippe, Hotz, Arnaud, Bousquet, Fabio, Levi, Thomas, Fisch, Joachim, Torhorst, Luc, Raymond
Publikováno v:
Scandinavian journal of work, environmenthealth. 28
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::80d180d9fd1fa6f8b2df8e0ba1bf34ba
https://pubmed.ncbi.nlm.nih.gov/11871426
https://pubmed.ncbi.nlm.nih.gov/11871426
Publikováno v:
Journal of affective disorders. 49(3)
Background : Depressed new mothers usually do not seek and therefore do not receive any psychiatric help. Methods : In order to assess predictive signs of postpartum depression (PPD), an unselected sample of 570 women were seen by midwives during the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2eb7931793ef0350dd8140cb95ec4187
https://pubmed.ncbi.nlm.nih.gov/9629946
https://pubmed.ncbi.nlm.nih.gov/9629946
Autor:
Singh, Jagar, Jerome, Ciavatti, Wei, Andy, Miller, Roderick, Arnaud, Bousquet, Lili, Cheng, Zang, Hui, Kasun, Punchihewa, Manjunatha, Prabhu, Biswanath, Senapati, Kumar, Anil, Pandey, Shesh Mani, Iyer, Natarajan M., Mittal, Anurag, Carter, Rick, Zhao, Lun, Manfred, Eller, Samavedam, Srikanth
Publikováno v:
2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers; 2014, p1-2, 2p