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Autor:
David P. Lerner, Benson Inkley, Shubhada H. Sahasrabudhe, Ethan Hansen, Luis D. Rojas Munoz, Arjan van de Ven
Publikováno v:
2022 IEEE International Test Conference (ITC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f04a93227bb5624b3910181f042081d1
https://doi.org/10.1109/itc50671.2022.00076
https://doi.org/10.1109/itc50671.2022.00076
