Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Aristakes Hovsepyan"'
Autor:
V.Sh. Melikyan, Zaven M. Avetisyan, A.E. Mkrtchyan, Aristakes Hovsepyan, A.Kh. Mkhitaryan, Artur A. Petrosyan, Synopsys Armenia Cjsc, Artak Hayrapetyan
Publikováno v:
Problems of advanced micro- and nanoelectronic systems development. :63-68
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ef46bf685635a84afac15ed6f23bc5d
https://doi.org/10.31114/2078-7707-2018-1-63-68
https://doi.org/10.31114/2078-7707-2018-1-63-68
Publikováno v:
EWDTS
Modern integrated circuits (IC) operate in environment of various destabilizing factors which have essential influence on the operation of these circuits and often even disturb the normal operation. One of these destabilizing factors is the cosmic ra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d1b923f5f899147f933c04fb508eb896
https://doi.org/10.1109/ewdts.2010.5742096
https://doi.org/10.1109/ewdts.2010.5742096
Autor:
Aristakes Hovsepyan, Grigor Harutyunyan, Vazgen Melikyan, Mkrtich Ishkhanyan, Tigran Hakobyan
Publikováno v:
2009 4th International Design and Test Workshop (IDT).
The purpose of this work is to add one more circuit into the PLL to define the lock condition. New types of PLL lock detectors, the principles of their operation, parametrical comparisons are presented. Presented circuits provide a simple design and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::563180f46064fe87cf37b76ca9741a2b
https://doi.org/10.1109/idt.2009.5404162
https://doi.org/10.1109/idt.2009.5404162
Publikováno v:
EWDTS
The purpose of this work is to add one more circuit into the traditional PLL to define the lock condition. Fully digital lock detector is presented. Presented circuit provides a simple design, process independence and design automation.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8432863b22bbc93da6b579378ae39543
https://doi.org/10.1109/ewdts.2008.5580147
https://doi.org/10.1109/ewdts.2008.5580147