Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Arfa Gondal"'
Autor:
Mahadeva Iyer Natarajan, E. Ehrichs, Arfa Gondal, Rakesh Ranjan, B. Parameshwaran, Joseph Versaggi, T. Nigam, Y. Liu, Andreas Kerber
Publikováno v:
2017 IEEE International Reliability Physics Symposium (IRPS).
Reliability assessment on 2T CMOS antifuse bitcell, consisting of two core NMOSFETs having a program transistor coupled in series with a select transistor, is presented. The discrepancy in the measured time to breakdown of program transistors and pre
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::50ab1c2484a33a3318d0f7b4c353374c
https://doi.org/10.1109/irps.2017.7936316
https://doi.org/10.1109/irps.2017.7936316
Autor:
Brian Holt, Tian Shen, Kong Boon Yeap, Arfa Gondal, Patrick Justison, Galor Wenyi Zhang, Walter Yao, Sing Fui Yap, San Leong Liew, Seungman Choi
Publikováno v:
IRPS
This study demonstrates the impact of electrode surface modulation on conduction mechanism and TDDB behavior. We found that the Schottky barrier height can be decreased by an unexpected change of the electrode surface materials, due to introduction o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::45f8d208a656104124682c5a365d4ad0
https://doi.org/10.1109/irps.2015.7112668
https://doi.org/10.1109/irps.2015.7112668
Autor:
Premachandran, C.S, Ranjan, Rakesh, Agarwal, Rahul, Fui, Yap Sing, Paliwoda, Peter, Sarasvathi, Thangaraju, Arfa, Gondal, Patrick, Justison, Mahadeva Iyer, Natarajan
Publikováno v:
2015 IEEE 65th Electronic Components & Technology Conference (ECTC); 2015, p2144-2148, 5p