Digital test circuit design and optimization for AC hot-carrier reliability characterization and model calibration under realistic high frequency stress conditions.

Autor: Jiang, W., Le, H., Kim, S.A., Chung, J.E., Wu, Y.-J., Bendix, P., Jensen, J., Ardans, R., Prasad, S., Kapoor, A., Kopley, T.E., Dungan, T., Marcoux, P.

Publikováno v: 1997 IEEE International Conference on Microelectronic Test Structures Proceedings; 1997, p56-62, 7p