Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Apneet Kaur"'
Autor:
Apneet Kaur, Bhupesh Goyal
Publikováno v:
ChemistrySelect. 5:13341-13350
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::44c5b1c35f34407aa8e2ddf5104f3e1c
https://doi.org/10.1002/slct.202003565
https://doi.org/10.1002/slct.202003565
Autor:
Apneet Kaur, Parminder Kaur
Publikováno v:
2020 International Conference on Smart Electronics and Communication (ICOSEC).
Wireless Mesh Networks(WMN) network has developed an AODV protocol to perform with two different phases namely Signal Broadcasting and Signal Acknowledgement. This protocol was implemented as the Shortest Path (SP) and high-speed data transferring in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2043f8064c45c273e7cd815b7ef09c45
https://doi.org/10.1109/icosec49089.2020.9215396
https://doi.org/10.1109/icosec49089.2020.9215396
Autor:
Thomas Hollstein, Apneet Kaur Sandhu, Jaan Raik, Siavoosh Payandeh Azad, Behrad Niazmand, Gert Jervan
Publikováno v:
ETS
2017 22nd IEEE European Test Symposium (ETS)
2017 22nd IEEE European Test Symposium (ETS)
With the scaling of silicon technology beyond the sub-micron domain, the probability of the system being exposed to different sources of faults increases. Manifestation of new defects during system's run-time, necessitates the need for a mechanism pr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::417973c40e3262d7c179b399b5d862f6
https://doi.org/10.1109/ets.2017.7968211
https://doi.org/10.1109/ets.2017.7968211
Autor:
Thomas Hollstein, Raimund Ubar, Siavoosh Payandeh Azad, Behrad Niazmand, Karl Janson, Apneet Kaur, Adeboye Stephen Oyeniran, Tsotne Putkaradze, Jaan Raik, Nevin George, Gert Jervan
Publikováno v:
DDECS
2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
Due to the ongoing miniaturization of silicon technology beyond the sub-micron domain and the trend of integrating ever more components on a single chip, the Network-on-Chip (NoC) paradigm has emerged to address the scalability and performance shortc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e67e6d3f6fe2d88f25c6061300935502
https://doi.org/10.1109/ddecs.2017.7934565
https://doi.org/10.1109/ddecs.2017.7934565
Autor:
Sonia Vatta, Apneet Kaur
Publikováno v:
International Journal of Engineering Research and.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b3f88d8efbfd2ae1056d88e539501bef
https://doi.org/10.17577/ijertv5is080081
https://doi.org/10.17577/ijertv5is080081
Autor:
Sonia Vatta, Apneet Kaur
Publikováno v:
International Journal of Engineering Research and.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b31afc08fc790d416553624a2c3bce8e
https://doi.org/10.17577/ijertv5is040639
https://doi.org/10.17577/ijertv5is040639
Autor:
Sven Nõmm, Maksim Jenihhin, Apneet Kaur, Jaan Raik, Leonidas Tsiopoulos, Jüri Vain, Kharchenko Vyacheslav S
Publikováno v:
Studies in Systems, Decision and Control
Studies in Systems, Decision and Control-Green IT Engineering: Social, Business and Industrial Applications
Green IT Engineering: Social, Business and Industrial Applications
Green IT Engineering: Social, Business and Industrial Applications ISBN: 9783030002527
Studies in Systems, Decision and Control-Green IT Engineering: Social, Business and Industrial Applications
Green IT Engineering: Social, Business and Industrial Applications
Green IT Engineering: Social, Business and Industrial Applications ISBN: 9783030002527
Term greenware capitalizes the energy efficiency, performance of processes and durability of hardware. Online monitoring/testing is a measure to support these features in autonomous mission critical systems (AMCS). The amount of time needed for sampl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0f770bc5c9f3044124d54e07e2de3362
Publikováno v:
2018 16th Biennial Baltic Electronics Conference (BEC)
The paper proposes a modeling approach for a MPSoC design using multi-view contracts enabling the formal interference analysis of design aspects. As an example, we focus on the behavioral, reliability and security views of the system design. For high
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bc62fb536ec487ed1fcd8c752f545d74
Autor:
Kaur, Apneet1 (AUTHOR), Goyal, Bhupesh1 (AUTHOR) bhupesh@thapar.edu
Publikováno v:
ChemistrySelect. Nov2020, Vol. 5 Issue 42, p13341-13350. 10p.
Publikováno v:
Current Science (00113891). 3/10/2014, Vol. 106 Issue 5, p744-748. 5p.