Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Anusorn, Tonmueanwai"'
Autor:
Souichi Telada, Mariko Kajima, Cynthia Lai, Anusorn Tonmueanwai, Peter Cox, Henry Chiu, George Tang, Oelof Kruger, Pieter Greeff, José Salgado, Jan Elfström, Sten Bergstrand, Pedro Bastos Costa, Wellington Santos Barros, Alejandro Acquarone Rossellino, Chin-Lung Tsai, Ngo Ngoc Anh, Liu Xiangbing, Adel Al-Kafri, Taebong Eom
Publikováno v:
Metrologia. 59:04006
Main text A regional key comparison on calibration of a line scale, APMP.L-K7 was conducted. KRISS acted as the pilot laboratory, and a total of 15 National Metrology Institutes, (10 from APMP, 3 from EURAMET, 1 from SIM, and 1 from AFRIMETS) have pa
Autor:
Jariya Buajarern, Takuma Doi, Girija Moona, Kentaro Sugawara, Rina Sharma, Anusorn Tonmueanwai, Wang Shihua, Michael Matus
Publikováno v:
Metrologia. 58:04003
Main text This intercomparison is carried out for step height standards with nominal step sizes 8 nm, 18 nm, 88 nm and 10 µm using non-contact measurement methods, with four participating NMIs. Measurement observation from the pilot laboratory exhib
Autor:
Geckeler, Ralf D., Just, Andreas, Vasilev, Valentin, Prieto, Emilio, Dvoracek, Frantisek, Zelenika, Slobodan, Przybylska, Joanna, Duta, Alexandru, Victorov, Ilya, Pisani, Marco, Saraiva, Fernanda, Salgado, Jose Antonio, Gao, Sitian, Anusorn, Tonmueanwai, Tan, Siew Leng, Cox, Peter, Watanabe, Tsukasa, Lewis, Andrew, Chaudhary, K. P., Thalmann, Ruedi
Öz bulunamadı.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=r39c86a4b39b::1a0d157e615f9ccb7174423f0226acda
https://aperta.ulakbim.gov.tr/record/93131
https://aperta.ulakbim.gov.tr/record/93131
Autor:
Ketsaya Vatcharanukul, Anusorn Tonmueanwai, A. P. Drijarkara, Tsukasa Watanabe, Watcharin Samit
Publikováno v:
Key Engineering Materials. 625:53-59
Self-A (Self-calibratable Angle device) rotary encoder can detect some kinds of angle error, not only its encoder scale error, but also the encoder attachment error (e.g. eccentricity error). When rotary table with built-in Self-A encoder rotates onl
Autor:
F. Saraiva, C. L. Tsai, Oelof Kruger, M. M. de Souza, Okhan Ganioglu, Laura Carcedo, R Thalmann, J A Salgado, Gian Bartolo Picotto, Sten Bergstrand, B. Hemming, Felix Meli, L. De Chiffre, S Zelenika, Anaïs Nicolet, Michael Matus, Anusorn Tonmueanwai, Zbigniew Ramotowski, Wang Shihua
Publikováno v:
Thalmann, R, Nicolet, A, Meli, F, Picotto, G B, Matus, M, Carcedo, L, Hemming, B, Ganioglu, O, De Chiffre, L, Saraiva, F, Bergstrand, S, Zelenika, S, Tonmueanwai, A, Tsai, C S, Shihua, W, Kruger, O, de Souza, M M, Salgado, J A & Ramotowski, Z 2016, ' Calibration of surface roughness standards ', Metrologia, vol. 53, no. 1A, 04001 . https://doi.org/10.1088/0026-1394/53/1A/04001
Thalmann, R, Nicolet, A, Meli, F, Picotto, G B, Matus, M, Carcedo, L, Hemming, B, Ganioglu, O, De Chiffre, L, Saraiva, F, Bergstrand, S, Zelenika, S, Tonmueanwai, A, Tsai, C-L, Shihua, W, Kruger, O, de Souza, M M, Salgado, J A & Ramotowski, Z 2016, ' Calibration of surface roughness standards ', Metrologia, vol. 53, no. Technical Supplement, 04001 . https://doi.org/10.1088/0026-1394/53/1A/04001
Thalmann, R, Nicolet, A, Meli, F, Picotto, G B, Matus, M, Carcedo, L, Hemming, B, Ganioglu, O, De Chiffre, L, Saraiva, F, Bergstrand, S, Zelenika, S, Tonmueanwai, A, Tsai, C-L, Shihua, W, Kruger, O, de Souza, M M, Salgado, J A & Ramotowski, Z 2016, ' Calibration of surface roughness standards ', Metrologia, vol. 53, no. Technical Supplement, 04001 . https://doi.org/10.1088/0026-1394/53/1A/04001
The key comparison EURAMET.L-K8.2013 on roughness was carried out in the framework of a EURAMET project starting in 2013 and ending in 2015. It involved the participation of 17 National Metrology Institutes from Europe, Asia, South America and Africa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2fcc38f50bdd6ca31006a1e22abad034
https://orbit.dtu.dk/en/publications/d442793d-1b4d-4bad-993e-cef98c9416ee
https://orbit.dtu.dk/en/publications/d442793d-1b4d-4bad-993e-cef98c9416ee
Publikováno v:
Journal of Physics: Conference Series. 901:012054
The diameter measurement of sphere is very important in dimensional metrology. The measurement of diameter is generally carried out by a comparison method or direct method using 1D linear measuring system. The probes touch both sides of the workpiece
Autor:
Michael Matus, Veselin Gavalyugov, Denita Tamakyarska, Nasser Alqahtani, Mohammad Alfohaid, Girija Moona, Rina Sharma, Asep Hapiddin, Ahmad Mohamad Boynawan, Monludee Ranusawud, Anusorn Tonmueanwai, Feng-Lei Hong, Jun Ishikawa, Lennart Robertsson
Publikováno v:
Metrologia. 54:04001
Lasers from four national metrological institutes (NMIs) were compared in 2014 as part of the CCL-K11 ongoing key comparison, initiated by the 13th meeting of the Comité Consultative des Longuers (CCL) in 2007. The absolute frequency of R(127) 11-5
Publikováno v:
2013 10th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology.
A Michelson interferometer method for determining the variation in length of gauge blocks is presented. This method is based on phase shift interferometer measuring a fringe fraction of the interference fringes on a gauge block measuring surface and
Autor:
Tae-Bong Eom, K P Chaudhary, Oelof Kruger, Z Xue, R M Halim, C S Kang, P Liou, Anusorn Tonmueanwai, Nurul Alfiyati, S L Tan, Shukmei Wong, T Watanabe, Peter Cox, M Dibo
Publikováno v:
Metrologia. 53:04006
A regional key comparison, APMP.L-K3 (calibration of angle standards) was held in 2005. Thirteen National Metrology Institutes (NMISA, NMIA, KRISS, NMIJ/ AIST, NMC/ A*STAR, NIMT, SCL, CMS/ ITRI, NPLI, RCM- LIPI, NIM, and NSCL) have participated in th
Publikováno v:
2011 International Quantum Electronics Conference (IQEC) and Conference on Lasers and Electro-Optics (CLEO) Pacific Rim incorporating the Australasian Conference on Optics, Lasers and Spectroscopy and the Australian Conference on Optical Fibre Technology.
A step gauge is a measurement standard that is used to verify a Coordinate Measuring Machine (CMM). The better the calibration system for the step gauge is, the greater the CMM verification can be. To achieve good step gauge calibration results, step