Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Antonio Vellei"'
Autor:
Roman Baburske, Antonio Vellei, F. Pfirsch, H.-J. Schulze, Haybat Itani, Alexander Philippou, Franz Josef Niedernostheide, Christian Jaeger, Johannes Georg Laven
Publikováno v:
2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD).
A failure mechanism in the edge termination of a 1200V IGBT during overcurrent turn-off is studied with simulations and verified by experiments. The position of the destruction in the experiment can be correlated to the formation of a critical filame
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::066e4d2d18550200adf95d2c93857f2a
https://doi.org/10.1109/ispsd.2015.7123402
https://doi.org/10.1109/ispsd.2015.7123402
