Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Anton D. Ermakov"'
Autor:
Anton D. Ermakov
Publikováno v:
Desertum Magnum: studia historica Великая степь: исторические исследования. :132-141
As the Mongolian People’s Republic became increasingly important to the Soviet Union’s foreign policy goals in the second half of the twentieth century, many Soviet specialists found themselves living and working in Mongolia for considerable amou
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f48227d053e83b08da50e63bc388c4be
https://doi.org/10.22162/2712-8431-2020-10-2-132-141
https://doi.org/10.22162/2712-8431-2020-10-2-132-141
Autor:
Anton D. Ermakov, Nina Yevtushenko
Publikováno v:
Automatic Control and Computer Sciences. 51:516-522
Extended finite state machines (EFSMs) are widely used when deriving tests for checking the functional requirements for software implementations. However, the fault coverage of EFSMbased tests covering appropriate paths, variables, etc., remains rath
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d6579b8782a6f5495519cf7fca30f1e6
https://doi.org/10.3103/s0146411617070057
https://doi.org/10.3103/s0146411617070057
Publikováno v:
2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM).
In this paper, we continue to investigate the problem of software security. The problem is to check if software under test has some vulnerabilities such as exceeding of admissible values of input/output parameters or internal variables or can reach s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::acd4c6e526dd7a0be665c3b4ba09e51e
https://doi.org/10.1109/edm.2018.8434938
https://doi.org/10.1109/edm.2018.8434938
Autor:
Nina Yevtushenko, Anton D. Ermakov
Publikováno v:
Труды Института системного программирования РАН, Vol 28, Iss 3, Pp 123-144 (2018)
The derivation of checking sequences for Finite State Machines (FSMs) has a long history. There are many papers devoted to deriving a checking sequence that can distinguish a complete deterministic specification FSM from any non-equivalent FSM with t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0fe134d2776a025c3ece78e387e47ef6
https://doi.org/10.15514/ispras-2016-28(3)-8
https://doi.org/10.15514/ispras-2016-28(3)-8
Publikováno v:
2017 18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM).
The paper is devoted to analyzing unsafe features of an Extended Finite State Machine such as the exceeding of the value of a context variable and/or an output parameter, the reachability of critical states, etc. As the ordinary simulation of an EFSM
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::494cb3b2ae77a73624e39bf327da8fd4
https://doi.org/10.1109/edm.2017.7981714
https://doi.org/10.1109/edm.2017.7981714
Publikováno v:
Testing Software and Systems ISBN: 9783319474427
ICTSS
ICTSS
A method is proposed for deriving an adaptive checking sequence for a given deterministic implementation of a nondeterministic Finite State Machine (FSM) specification with respect to the reduction relation. The implementation is non-initialized, i.e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7eaaaa054e1abc9b5235f561415c4e69
https://doi.org/10.1007/978-3-319-47443-4_9
https://doi.org/10.1007/978-3-319-47443-4_9
Autor:
Nina Yevtushenko, Anton D. Ermakov
Publikováno v:
System Informatics.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f9047daedaf8227ac0ec8d6c3a09cb4
https://doi.org/10.31144/si.2307-6410.2016.n7.p23-32
https://doi.org/10.31144/si.2307-6410.2016.n7.p23-32
Publikováno v:
2015 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices.
When a fault is detected in the composition of software components the question arises how to locate a faulty component as well as a faulty instruction within the component. In this paper, we consider a practical approach by calculating how many time
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::91759cce50d0290f8bb4bbc71781a22c
https://doi.org/10.1109/edm.2015.7184508
https://doi.org/10.1109/edm.2015.7184508
Autor:
Anton D. Ermakov
Publikováno v:
2014 15th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ed487ea33dd059dcea7761e90880a1f
https://doi.org/10.1109/edm.2014.6882499
https://doi.org/10.1109/edm.2014.6882499