Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Antoine Roy-Gobeil"'
Autor:
Yoichi Miyahara, Harrisonn Griffin, Antoine Roy-Gobeil, Ron Belyansky, Hadallia Bergeron, José Bustamante, Peter Grutter
Publikováno v:
EPJ Techniques and Instrumentation, Vol 7, Iss 1, Pp 1-11 (2020)
Abstract Reliable operation of frequency modulation mode atomic force microscopy (FM-AFM) depends on a clean resonance of an AFM cantilever. It is recognized that the spurious mechanical resonances which originate from various mechanical components i
Externí odkaz:
https://doaj.org/article/a5169b8d6c9344e488ef4404eaeb1bd8
Publikováno v:
Nano Letters. 19:6104-6108
Long-range electron transfer is a ubiquitous process that plays an important role in electrochemistry, biochemistry, organic electronics, and single molecule electronics. Fundamentally, quantum mechanical processes, at their core, manifest through bo
Autor:
Yoichi Miyahara, Peter Grutter, Hadallia Bergeron, Harrisonn Griffin, Ron Belyansky, José Bustamante, Antoine Roy-Gobeil
Publikováno v:
EPJ Techniques and Instrumentation, Vol 7, Iss 1, Pp 1-11 (2020)
Reliable operation of frequency modulation mode atomic force microscopy (FM-AFM) depends on a clean resonance of an AFM cantilever. It is recognized that the spurious mechanical resonances which originate from various mechanical components in the mic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::85766387cd585e6c12ed42d5236dca1a
Publikováno v:
The Journal of Chemical Physics. 149:104109
In this work, we explore Franck-Condon blockade in the "redox limit," where nuclear relaxation processes occur much faster than the rate of electron transfer. To this end, the quantized rate expressions for electron transfer are recast in terms of a
Publikováno v:
Nano letters. 15(4)
We present theoretical and experimental studies of the effect of the density of states of a quantum dot (QD) on the rate of single-electron tunneling that can be directly measured by electrostatic force microscopy (e-EFM) experiments. In e-EFM, the m
Publikováno v:
Nanotechnology. 28:064001
Electric charge detection by atomic force microscopy (AFM) with single- electron resolution (e-EFM) is a promising way to investigate the electronic level structure of individual quantum dots (QD). The oscillating AFM tip modulates the energy of the
Publikováno v:
Nano Letters; Apr2015, Vol. 15 Issue 4, p2324-2328, 5p