Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Antoine D. Touboul"'
Autor:
Ygor Q. Aguiar, Frédéric Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul
Publikováno v:
Aerospace, Vol 7, Iss 2, p 12 (2020)
Due to the intrinsic masking effects of combinational circuits in digital designs, Single-Event Transient (SET) effects were considered irrelevant compared to the data rupture caused by Single-Event Upset (SEU) effects. However, the importance of con
Externí odkaz:
https://doaj.org/article/e03cc6de11ca46b38f5437bd3ff1379f
Autor:
Rosine Coq Germanicus, Kimmo Niskanen, Alain Michez, Niemat Moultif, Wadia Jouha, Olivier Latry, Jerôme Boch, Ulrike Lüders, Antoine D. Touboul
Publikováno v:
Materials Science Forum
Materials Science Forum, 2022, 1062, pp.544-548. ⟨10.4028/p-973n9u⟩
Materials Science Forum, 2022, 1062, pp.544-548. ⟨10.4028/p-973n9u⟩
International audience; Dealing with electronic devices for high reliability applications in terrestrial environments, neutron-induced Single Event Effects must be investigated. In this paper, the experimental observation of an atmospheric-like neutr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9d851d3474f2fe0700f09f45450f4159
https://hal.science/hal-03702520
https://hal.science/hal-03702520