Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Antoine D. Touboul"'
Autor:
Ygor Q. Aguiar, Frédéric Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul
Publikováno v:
Aerospace, Vol 7, Iss 2, p 12 (2020)
Due to the intrinsic masking effects of combinational circuits in digital designs, Single-Event Transient (SET) effects were considered irrelevant compared to the data rupture caused by Single-Event Upset (SEU) effects. However, the importance of con
Externí odkaz:
https://doaj.org/article/e03cc6de11ca46b38f5437bd3ff1379f
Autor:
Rosine Coq Germanicus, Kimmo Niskanen, Alain Michez, Niemat Moultif, Wadia Jouha, Olivier Latry, Jerôme Boch, Ulrike Lüders, Antoine D. Touboul
Publikováno v:
Materials Science Forum
Materials Science Forum, 2022, 1062, pp.544-548. ⟨10.4028/p-973n9u⟩
Materials Science Forum, 2022, 1062, pp.544-548. ⟨10.4028/p-973n9u⟩
International audience; Dealing with electronic devices for high reliability applications in terrestrial environments, neutron-induced Single Event Effects must be investigated. In this paper, the experimental observation of an atmospheric-like neutr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9d851d3474f2fe0700f09f45450f4159
https://hal.science/hal-03702520
https://hal.science/hal-03702520
Publikováno v:
2014 IEEE Radiation Effects Data Workshop (REDW); 2014, p1-8, 8p
Autor:
Touboul, Antoine D., Foro, Lionel L., Wrobel, Frederic, Guetarni, Karima, Boch, Jerome, Saigne, Frederic
Publikováno v:
IEEE Transactions on Nuclear Science; Jul2013 Part 1, Vol. 60 Issue 4, p2392-2396, 5p
Publikováno v:
IEEE Transactions on Nuclear Science; Jul2013 Part 1, Vol. 60 Issue 4, p2537-2541, 5p
Autor:
Boch, Jérôme, Velo, Yago Gonzalez, Saigne, Frédéric, Roche, Nicolas J.-H., Schrimpf, Ronald D., Vaillé, Jean-Roch, Dusseau, Laurent, Chatry, Christian, Lorfëvre, Eric, Ecoffet, Robert, Touboul, Antoine D.
Publikováno v:
IEEE Transactions on Nuclear Science; Dec2009 Part 1 of 2, Vol. 56 Issue 6, p3347-3353, 7p
Autor:
Marinoni, Mathias, Touboul, Antoine D., Zander, Damien, Petit, Christian, Carvalho, Aminata M. J. F., Wrobel, Frédéric, Saigné, Frédéric, Weulersse, Cecile, Miller, Florent, Carrière, Thierry, Lorfèvre, Eric
Publikováno v:
IEEE Transactions on Nuclear Science; Aug2009 Part 2 of 3, Vol. 56 Issue 4, p2213-2217, 5p, 5 Graphs
Autor:
Marinoni, Mathias, Touboul, Antoine D., Zander, Damien, Petit, Christian, Wrobel, Frédéric, Carvalho, Aminata M. J. F., Arinero, Richard, Ramonda, Michel, Saigné, Frédéric, Weulersse, Cecile, Buard, Nadine, Carrière, Thierry, Lorfèvre, Eric
Publikováno v:
IEEE Transactions on Nuclear Science; Dec2008 Part 1 of 2, Vol. 55 Issue 6, p2970-2974, 5p, 1 Diagram, 6 Graphs
Autor:
Aguiar, Ygor Q., Wrobel, Frédéric, Autran, Jean-Luc, Leroux, Paul, Saigné, Frédéric, Pouget, Vincent, Touboul, Antoine D.
Publikováno v:
Aerospace (MDPI Publishing); Feb2020, Vol. 7 Issue 2, p12-12, 1p
Selected peer-reviewed extended papers abstracts of which were presented at the 13th European Conference on Silicon Carbide and Related Materials (ECSCRM 2020-2021)