A History of Regulatory Animal Testing: What Can We Learn?

Autor: Doortje Swaters, Anne van Veen, Wim van Meurs, Janette Ellen Turner, Merel Ritskes-Hoitinga

Publikováno v: Swaters, D, van Veen, A, van Meurs, W, Turner, J E & Ritskes-Hoitinga, M 2022, ' A History of Regulatory Animal Testing : What Can We Learn? ', Alternatives to Laboratory Animals, vol. 50, no. 5, pp. 322-329 . https://doi.org/10.1177/02611929221118001
Alternatives to Laboratory Animals, 50, 322-329
Alternatives to Laboratory Animals, 50, 5, pp. 322-329

The contemporary pharmaceutical industry is voicing growing concerns about the translatability and reproducibility of animal models. In addition, the usefulness of certain of the required regulatory safety tests in animals is being increasingly quest

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b738bb29f94466758fc86fd469ca4354
https://pubmed.ncbi.nlm.nih.gov/35983829

Extreme High-Resolution SEM: A Paradigm Shift

Autor: Richard J. Young, Trevor Dingle, Laurent Roussel, Sander Henstra, Gerard Nicolaas Anne van Veen, Todd Templeton, Ingo Gestmann

Publikováno v: Microscopy Today. 16:24-29

“Extreme high-resolution” (XHR) scanning electron microscopy (SEM) has the potential to change the way we look at SEM. Anyone in the SEM world knows that you don't do high-resolution SEM at low accelerating voltages because of chromatic aberratio

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::807e5b4626012914f15b2b0905ce267c
https://doi.org/10.1017/s1551929500059745

XHR SEM: enabling extreme high resolution scanning electron microscopy

Autor: Trevor Dingle, Ingo Gestmann, Albert Mangnus, Jarda Chmelik, Richard J. Young, Gerard Nicolaas Anne van Veen, Sander Henstra

Publikováno v: Scanning Microscopy 2009.

The low voltage scanning electron microscope (SEM) is widely used in many industrial and research applications due to its ability to image surface details and to minimize charging and beam damage effects on sensitive samples. However, fundamental lim

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::2488b423bb4a93d3fd2ac65eb936b1a0
https://doi.org/10.1117/12.824749

A Two-Stage Gas Amplification Secondary Electron Detector for Ultra-High Resolution Imaging

Autor: Gerard Nicolaas Anne van Veen, Rene Peter Marie Schroemges, Brad Thiel, Milos Toth, Jacob Johannes Scholtz, William Ralph Knowles

Publikováno v: Microscopy and Microanalysis. 10:1058-1059

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::913bee49badbf76a2ef4c36a81467f15
https://doi.org/10.1017/s1431927604884654