Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Anne M. Kerkenaar"'
Autor:
Melissa Cremers, Arno A. C. Bode, Vedran Vonk, Anne M. Kerkenaar, Aryan E. F. de Jong, Diego Pontoni, Wiesiek J. Szweryn, Gregor Nowak, Helmut Dosch, Elias Vlieg
Publikováno v:
Langmuir, 33, 814-819
Langmuir, 33, 3, pp. 814-819
Langmuir, 33, 3, pp. 814-819
Our in situ X-ray study shows that a silicon substrate in contact with an undersaturated In(Ge) solution is wetted by an approximately 1 nm thin germanium film, which does not grow any thicker. The results can be understood by the use of thickness-de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4d4effe6d2911930d3e00c8e52d00a30
https://doi.org/10.1021/acs.langmuir.6b03984
https://doi.org/10.1021/acs.langmuir.6b03984
Autor:
Miguel F. Mantilla, Dirk J. Kok, Elias Vlieg, Shanfeng Jiang, Anne M. Kerkenaar, Willem J. P. van Enckevort, Jan A. M. Meijer, Arno A. C. Bode, Vedran Vonk, Fieke J. van den Bruele
Publikováno v:
Crystal Growth & Design, 12, 1919-1924
Crystal Growth & Design, 12, 4, pp. 1919-1924
Crystal Growth & Design, 12, 4, pp. 1919-1924
Sodium chloride crystals have a strong tendency to cake, which can be prevented by treating them with the anticaking agent ferrocyanide. Using surface X-ray diffraction, we show how the ferrocyanide ion sorbs onto the {100} face of the sodium chlorid
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b6ad54f7ec722a6249f054a1db7666e7
http://hdl.handle.net/2066/93756
http://hdl.handle.net/2066/93756
