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Autor:
Anne L. Joudrier, Christian Andriamiadamanana, I. A. Mamedova, Jean Francois Guillemoles, Eldar Mammadov, Sardar Babayev, Naghi Gasimov, Negar Naghavi, Nazim Mamedov
Publikováno v:
physica status solidi c. 12:600-604
The 200 to 300 nm thick, Er and Er,Yb doped Y2O3 films deposited onto silicon substrate by spin coating have been studied by spectroscopic ellipsometry over the 192-1680 nm spectral range at room temperature. All samples have been found to be strongl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::62cc5063bba2ee896205994e16c5e5f6
https://doi.org/10.1002/pssc.201400301
https://doi.org/10.1002/pssc.201400301
