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pro vyhledávání: '"Anna-Karin M. Wanchoo"'
Publikováno v:
Microelectronics Reliability. 29:587-602
A general expression is obtained for the reliability of two dependent paralleled devices, where the form of the dependency involves a change in the operating conditions or environment (and, accordingly, the life distribution) of the survivor when one
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c3e646423e7a233649b456454c3cdec6
https://doi.org/10.1016/0026-2714(89)90349-1
https://doi.org/10.1016/0026-2714(89)90349-1
