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pro vyhledávání: '"Anna Harmasz"'
Autor:
Paweł Piotr Michałowski, Tymoteusz Ciuk, Pawel Kaminski, Anna Harmasz, Janusz Płocharski, Rafał Budzich, Roman Kozlowski, Jaroslaw Gaca
Publikováno v:
Journal of Materials Chemistry C. 9:4393-4404
State-of-the-art secondary ion mass spectrometry (SIMS), X-ray reflectivity (XRR) and atomic force microscopy (AFM) have been used to determine the effect of oxidation temperature on the inhomogeneity of chemical composition and density in nanometric
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d564d05661979568330fcd9a31fda88c
https://doi.org/10.1039/d0tc05988a
https://doi.org/10.1039/d0tc05988a
