Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Ann-Katrin Thamm"'
Autor:
Michal Bodik, Christopher Walker, Maksym Demydenko, Thomas Michlmayr, Thomas Bähler, Urs Ramsperger, Ann-Katrin Thamm, Steve Tear, Andrew Pratt, Mohamed El-Gomati, Danilo Pescia
Publikováno v:
Ultramicroscopy, 238
Electron spectroscopy proves to be a handy tool in material science. Combination of electron spectroscopy and scanning probe microscopy is possible through Scanning Field Emission Microscopy (SFEM), where a metallic probe positioned close to the surf
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9eaf5f8c5c5c5f0fea5f74c1da0db6c7
Autor:
Thomas Michlmayr, Maksym Hennadiiovych Demydenko, C. G. H. Walker, Danilo Pescia, S.P. Tear, T. Bahler, Urs Ramsperger, Ann-Katrin Thamm, M.M. El Gomati, M Bodik, Andrew Pratt
Publikováno v:
2021 34th International Vacuum Nanoelectronics Conference (IVNC).
In this study, we use Scanning Field Emission Microscopy (SFEM) combined with a miniature electron energy analyzer known as a Bessel box to measure electron energy spectra emitted from a sample. Previous studies using SFEM have revealed that the work
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b4ac72527fc481bab27347e3abddd0ef
https://doi.org/10.1109/ivnc52431.2021.9600768
https://doi.org/10.1109/ivnc52431.2021.9600768
Autor:
Marc-Dominik Krass, Martin Héritier, Alexander Eichler, Romana Schirhagl, Thomas Gisler, Letizia Catalini, Albert Schliesser, Eric C. Langman, Urs Grob, Hinrich Mattiat, David Hälg, Christian L. Degen, Ann-Katrin Thamm, Yeghishe Tsaturyan
Publikováno v:
Physical Review Applied
Halg, D, Gisler, T, Tsaturyan, Y, Catalini, L, Grob, U, Krass, M-D, Heritier, M, Mattiat, H, Thamm, A-K, Schirhagl, R, Langman, E C, Schliesser, A, Degen, C L & Eichler, A 2021, ' Membrane-Based Scanning Force Microscopy ', Physical Review Applied, vol. 15, no. 2, 021001 . https://doi.org/10.1103/PhysRevApplied.15.L021001
Physical Review Applied, 15 (2)
Physical Review Applied, 15(2):L021001. AMER PHYSICAL SOC
Halg, D, Gisler, T, Tsaturyan, Y, Catalini, L, Grob, U, Krass, M-D, Heritier, M, Mattiat, H, Thamm, A-K, Schirhagl, R, Langman, E C, Schliesser, A, Degen, C L & Eichler, A 2021, ' Membrane-Based Scanning Force Microscopy ', Physical Review Applied, vol. 15, no. 2, 021001 . https://doi.org/10.1103/PhysRevApplied.15.L021001
Physical Review Applied, 15 (2)
Physical Review Applied, 15(2):L021001. AMER PHYSICAL SOC
We report the development of a scanning force microscope based on an ultrasensitive silicon nitride membrane optomechanical transducer. Our development is made possible by inverting the standard microscope geometry—in our instrument, the substrate
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::98042a64d18469f34d03f411cb27d3a2
https://doi.org/10.1103/PhysRevApplied.15.L021001
https://doi.org/10.1103/PhysRevApplied.15.L021001
Autor:
Maksym Hennadiiovych Demydenko, Ann-Katrin Thamm, Thomas Michlmayr, Danilo Pescia, Urs Ramsperger
Publikováno v:
2020 33rd International Vacuum Nanoelectronics Conference (IVNC).
the design of the low-temperature scanning probe microscope, which works in field emission regime with spin polarization analysis, is proposed. A performance at temperature of 77 K has been achieved. The first result of STM imaging with atomic resolu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::060528aedfda163c28675815fffb6149
https://doi.org/10.1109/ivnc49440.2020.9203490
https://doi.org/10.1109/ivnc49440.2020.9203490
Publikováno v:
2020 33rd International Vacuum Nanoelectronics Conference (IVNC)
An ultra-high vacuum Scanning Tunneling Microscope (STM) is converted into a lens-less low-energy Scanning Electron Microscope when the tip-target distance is some tens of nanometers and the tip acts as a source of field emitted electrons. This prima
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::acf6a4d7decce3437d3c36a8ed04e531
https://hdl.handle.net/20.500.11850/447650
https://hdl.handle.net/20.500.11850/447650
Autor:
Berthold Stöger, Johannes Fröhlich, Thomas Mathis, Brigitte Holzer, Christian Hametner, Daniel Lumpi, Barbara Dellago, Ernst Horkel, Bertram Batlogg, Ann-Katrin Thamm
Publikováno v:
Chemistry (Weinheim an der Bergstrasse, Germany). 26(13)
A reliable synthetic protocol toward a series of fused chalcogenopheno[1]benzochalcogenophene (CBC) building blocks was developed based on a Fiesselmann reaction. The obtained CBC units were applied in McMurry and Stille coupling reactions toward sym
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1ca4407c2f8a2995f7b5817f90afa585
https://pubmed.ncbi.nlm.nih.gov/31729785
https://pubmed.ncbi.nlm.nih.gov/31729785
Autor:
Christian Hametner, Johannes Fröhlich, Daniel Lumpi, Berthold Stöger, Barbara Dellago, Ann-Katrin Thamm, Brigitte Holzer, Ernst Horkel, Thomas Mathis, Bertram Batlogg
Publikováno v:
Chemistry – A European Journal. 26:2764-2764
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::646513a70a0068ba46a58bafb103ff43
https://doi.org/10.1002/chem.202000230
https://doi.org/10.1002/chem.202000230