Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Ann Opdebeeck"'
Autor:
Lilach Choona, Jasmine Linshiz, Shaul Pres, Boris Levant, Noam Tal, Gaetano Santoro, Sylvain Baudot, Ann Opdebeeck, Jason Reifsnider, Senthil Vadakupudhu Palayam, Lorusso Gian, Jerome Mitard, Shay Yogev
Publikováno v:
Metrology, Inspection, and Process Control XXXVII.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::253ebc6832c19f2fb7d51fcc561c3b41
https://doi.org/10.1117/12.2658294
https://doi.org/10.1117/12.2658294
Autor:
Geert Van der Plas, Paresh Limaye, Abdelkarim Mercha, Herman Oprins, Cristina Torregiani, Steven Thijs, Dimitri Linten, Michele Stucchi, Katti Guruprasad, Dimitrios Velenis, Domae Shinichi, Vladimir Cherman, Bart Vandevelde, Veerle Simons, Ingrid De Wolf, Riet Labie, Dan Perry, Stephane Bronckers, Nikolas Minas, Miro Cupac, Wouter Ruythooren, Jan Van Olmen, Alain Phommahaxay, Muriel de Potter de ten Broeck, Ann Opdebeeck, Michal Rakowski, Bart De Wachter, Morin Dehan, Marc Nelis, Rahul Agarwal, Wim Dehaene, Youssef Travaly, Pol Marchal, Eric Beyne
Publikováno v:
2010 IEEE International Solid-State Circuits Conference - (ISSCC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1906204f67f343416668e52febbcd5dd
https://doi.org/10.1109/isscc.2010.5434016
https://doi.org/10.1109/isscc.2010.5434016