Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Anja Fast"'
Autor:
Edward Brazil, Janusz Rajski, Srikanth Venkataraman, Rudrajit Dutta, Anja Fast, Peter Maxwell, Will Howell, A. Glowatz, Friedrich Hapke
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 40:584-597
This article describes a defect-oriented test (DOT) approach, which enables a complete physical defect-based automatic test pattern generation (ATPG) for the digital logic area of CMOS-based designs. Total critical area (TCA)-based methods are presen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::914235117db8d663555c539dcadb0c91
https://doi.org/10.1109/tcad.2020.3001259
https://doi.org/10.1109/tcad.2020.3001259
Autor:
Marek Hustava, Juergen Schloeffel, M. Reese, W. Redemund, Anja Fast, Martin Keim, Friedrich Hapke, Janusz Rajski, A. Glowatz
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 33:1396-1409
This paper describes the new cell-aware test (CAT) approach, which enables a transistor-level and defect-based ATPG on full CMOS-based designs to significantly reduce the defect rate of manufactured ICs, including FinFET technologies. We present resu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e79e7d3136c5a39c5d7b528fb784f098
https://doi.org/10.1109/tcad.2014.2323216
https://doi.org/10.1109/tcad.2014.2323216
Autor:
J. F. Goncalves, Juergen Schloeffel, A. Glowatz, S. Straehle, Janusz Rajski, Gwenolé Maugard, Anja Fast, A. Prashanthi, Friedrich Hapke, R. Behr, Matthias Beck, Ralf Arnold, A. Panait, M. Baby, W. Redemund
Publikováno v:
ETS
High quality is an absolute necessity for automotive designs. This paper describes an approach to improve the overall defect coverage for CMOS-based high quality automotive designs. We present results from a cell-aware (CA) characterization flow for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4c1d8da6aad37c15abb7a6da7e3cea07
https://doi.org/10.1109/ets.2014.6847814
https://doi.org/10.1109/ets.2014.6847814
Autor:
A. Glowatz, W. Redemund, Brady Benware, Juergen Schloeffel, T. Heidel, Thomas Herrmann, A. Over, Janusz Rajski, M. Reese, Anja Fast, J. Rivers, Friedrich Hapke, Martin Keim
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper describes a new approach for quickly ramping up the yield for new CMOS technologies by performing a cell-internal (CI) diagnosis based on the cell-aware (CA) methodology. We present results from carrying out this new method on a test chip
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::54fb83b4dd87ec93c64f185916023ed2
https://doi.org/10.31399/asm.cp.istfa2013p0594
https://doi.org/10.31399/asm.cp.istfa2013p0594