Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Angelo Rossoni"'
Autor:
Stefano Tonello, S. Minehane, Sharad Saxena, Christoph Dolainsky, Angelo Rossoni, H. Karbasi, P. McNamara, Christopher Hess, M. Quarantelli, S. Lucherini
Publikováno v:
IEEE Transactions on Electron Devices. 55:131-144
Variation in transistor characteristics is increasing as CMOS transistors are scaled to nanometer feature sizes. This increase in transistor variability poses a serious challenge to the cost-effective utilization of scaled technologies. Meeting this
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d2492d1eb59eb03f42332d71eab27f25
https://doi.org/10.1109/ted.2007.911351
https://doi.org/10.1109/ted.2007.911351
Autor:
Sa Zhao, S. Subramanian, Sharad Saxena, D. Slisher, H. Karbasi, Stefano Tonello, Christopher Hess, M. Quarantelli, Angelo Rossoni
Publikováno v:
2007 IEEE International Conference on Microelectronic Test Structures.
Lower supply voltages and aggressive OPC on 65 nm and below technologies are causing larger variability of critical device parameters like Vt and Id. With ever increasing clock frequencies, more and more performance related yield loss can be observed
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b8210543c4afad6e3f8f4651d0fd6a40
https://doi.org/10.1109/icmts.2007.374472
https://doi.org/10.1109/icmts.2007.374472