Zobrazeno 1 - 10
of 20
pro vyhledávání: '"Angelo Ciccazzo"'
Publikováno v:
Journal of Mathematics in Industry, Vol 12, Iss 1, Pp 1-13 (2022)
Abstract In this paper the industrial application of Reduced Order Multirate (ROMR) schemes is presented. This paper contains the mathematical foundations of the ROMR schemes and elaborates on the construction of these schemes using specific Model Or
Externí odkaz:
https://doaj.org/article/c76e06d2e5f14b18a5ac89a8f6e9bba2
Publikováno v:
Applied Numerical Mathematics
In the context of time-domain simulation of integrated circuits, one often encounters large systems of coupled differential-algebraic equations. Simulation costs of these systems can become prohibitively large as the number of components keeps increa
Autor:
Marcus Bannenberg, Andreas Bärmann, Patricia Barral, Jean-David Benamou, Federico Bianco, Andres Binder, Guillaume Chazareix, Angelo Ciccazzo, Ricardo Conte, Daniel Fernandez Comesana, Girfoglio, Michele, Günther, Michael, Ijzerman, Wilbert, Jadhav, Onkar, Alejandro Lengomin, Alexander Martin, Marco Martinolli, Volker Mehrmann, Umberto Morelli, Ashwin Nayak, Luc Polverelli, Andres Prieto, Peregrina Quintela, Ronny Ramlau, Gianluigi Rozza, Giorgi Rukhaia, Shah, Nirav, Giovanni Stabile, Bernadett Stadler, Jonasz Staszek, Christian Vergara
Project deliverable D5.3
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8dc400a18ce86f038eea1d07f4312004
Publikováno v:
Applied Mathematics Letters
In refined network simulation one is faced with simulating coupled dynamical systems, as for instance circuits are coupled to heat or electromagnetics. Simulation costs of such coupled systems can be reduced by both model order reduction and multirat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8f059af0f3550de1551424ba5361ad77
https://zenodo.org/record/4542744
https://zenodo.org/record/4542744
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 35:1224-1228
Yield optimization is a challenging topic in electronic circuit design. Methods for yield optimization based on Monte Carlo (MC) analysis of a circuit whose behavior is reproduced by simulations usually require too many time expensive simulations to
Autor:
Angelo Ciccazzo, Fabio Cenni, Gaetano Rascona, Pomarico Anna Angela, Roselli Giuditta, Franco Fummi, Michele Lora, Michelangelo Grosso, Sandro Dalle Feste, Ignazio Blanco, Fabio Grilli, Giuliana Gangemi, Salvatore Rinaudo, Mirko Guarnera, Roberto Carminati
Publikováno v:
Smart Systems Integration and Simulation ISBN: 9783319273907
This chapter presents two case studies showing how the proposed approach applies to smart system design and optimization. The former is the virtual prototyping platform built for a laser pico-projector actuator, where MEMS, analog and digital compone
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f88fbce6a5138360b61953b847290ac2
https://doi.org/10.1007/978-3-319-27392-1_8
https://doi.org/10.1007/978-3-319-27392-1_8
Publikováno v:
Mathematics in Industry ISBN: 9783319234120
In this work we propose an approach that combines a Support Vector learning Machine with a Derivative-Free black box optimization algorithm in order to maximize the yield in the production of electronic circuits. This approach is tested on a circuit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d74ddaf2f481eb80b531c6cd87da7e0d
https://doi.org/10.1007/978-3-319-23413-7_60
https://doi.org/10.1007/978-3-319-23413-7_60
Publikováno v:
Mathematics in Industry ISBN: 9783319234120
The nano-CMOS technology scaling makes the figures of merit of a circuit, such as performance and power, extremely sensitive to uncontrollable statistical process variation (PV). In this context, multi-objective optimization algorithms and statistica
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::716127b9ba808099dfaaed8bce87ee88
https://doi.org/10.1007/978-3-319-23413-7_58
https://doi.org/10.1007/978-3-319-23413-7_58
Publikováno v:
Mathematics in Industry ISBN: 9783319234120
The production of semiconductor integrated circuits is very complex and expensive. Therefore, it is essential to verify the designed circuits before they are fabricated. Due to the process variations, nanoscale circuits have to be simulated many time
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b0a127a26ab7eca3fe95cbafd6f7b125
https://doi.org/10.1007/978-3-319-23413-7_59
https://doi.org/10.1007/978-3-319-23413-7_59
Yield optimization is a challenging topic in electronic circuit design. Methods for Yield optimization based on Montecarlo analysis of a circuit whose behavior is reproduced by simulations usually require too many time expensive simulations to be eff
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______645::822c5400f49aef4be263e1e2c34c5d2e
http://www.dis.uniroma1.it/~bibdis/RePEc/aeg/report/2015-03.pdf
http://www.dis.uniroma1.it/~bibdis/RePEc/aeg/report/2015-03.pdf