Zobrazeno 1 - 10
of 80
pro vyhledávání: '"Angeliki Kritikakou"'
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE, 2021, pp.1-14. ⟨10.1109/TCAD.2021.3101406⟩
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2021, pp.1-14. ⟨10.1109/TCAD.2021.3101406⟩
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE, 2021, pp.1-14. ⟨10.1109/TCAD.2021.3101406⟩
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2021, pp.1-14. ⟨10.1109/TCAD.2021.3101406⟩
International audience; Since several decades, fault tolerance has become a major research field due to transistor shrinking and core number increasing in System-on-Chip (SoC). Especially, faults occurring to Network-on-Chips (NoCs) of those systems
Publikováno v:
ACM Transactions on Design Automation of Electronic Systems.
Mixed-critical systems consist of applications with different criticality. In these systems, different confidence levels of Worst-Case Execution Time (WCET) estimations are used. Dual criticality systems use a less pessimistic, but with lower level o
Publikováno v:
ACM Transactions on Sensor Networks; Nov2023, Vol. 19 Issue 4, p1-26, 26p
Publikováno v:
Journal of Systems Architecture
Journal of Systems Architecture, 2023, 134, pp.102790. ⟨10.1016/j.sysarc.2022.102790⟩
Journal of Systems Architecture, 2023, 134, pp.102790. ⟨10.1016/j.sysarc.2022.102790⟩
International audience; Minimizing energy consumption, as well as meeting real-time and reliability constraints, are major goals during system deployment. When complex platforms, such as multicore architectures with DVFS, and parallel applications ar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::941135859ba6f775dd5f80d590157b45
https://hal.science/hal-03888480
https://hal.science/hal-03888480
Publikováno v:
NANOARCH 2022-17th ACM International Symposium on Nanoscale Architectures
NANOARCH 2022-17th ACM International Symposium on Nanoscale Architectures, Dec 2022, Virtual, France. pp.1-6
NANOARCH 2022-17th ACM International Symposium on Nanoscale Architectures, Dec 2022, Virtual, France. pp.1-6
International audience; Due to transistor shrinking and core number increasing in System-on-Chip (SoC), fault tolerance has become a critical concern. Given the amount of data communications on such architectures, Network-on-Chips (NoCs) lead a cruci
Autor:
Fernando Fernandes dos Santos, Angeliki Kritikakou, Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Matteo Sonza Reorda, Olivier Sentieys, Paolo Rech
Publikováno v:
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, In press
HAL
IEEE Transactions on Nuclear Science, In press
HAL
International audience; The reliability evaluation of Deep Neural Networks (DNNs) executed on Graphic Processing Units (GPUs) is a challenging problem since the hardware architecture is highly complex and the software frameworks are composed of many
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b036b2a14f2fa671b3456083673a479f
https://hal.inria.fr/hal-03865253
https://hal.inria.fr/hal-03865253
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2022, pp.1-15. ⟨10.1109/TCAD.2022.3222293⟩
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2022, pp.1-15. ⟨10.1109/TCAD.2022.3222293⟩
International audience; Heterogeneous multi-core platforms, such as ARM big.LITTLE are widely used to execute embedded applications under multiple and contradictory constraints, such as energy consumption and real-time execution. To fulfill these con
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::43acb1c29b9136acef3b52b0ad44a4c8
https://hal.science/hal-03854671
https://hal.science/hal-03854671
Publikováno v:
NSREC 2022-IEEE Nuclear & Space Radiation Effects Conference
NSREC 2022-IEEE Nuclear & Space Radiation Effects Conference, Jul 2022, Provo, United States. pp.1-5
HAL
NSREC 2022-IEEE Nuclear & Space Radiation Effects Conference, Jul 2022, Provo, United States. pp.1-5
HAL
International audience; We characterize the fault models for Deep Neural Networks (DNNs) in GPUs exposed to neutron. We observe tolerable and critical errors, and show that ECC is not effective in reducing critical errors.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::902737a8493a3cee58d869cf4aba5b3a
https://inria.hal.science/hal-03652138/file/main_hal.pdf
https://inria.hal.science/hal-03652138/file/main_hal.pdf
Publikováno v:
HAL
IOLTS 2022-28th IEEE International Symposium on OnLine Testing and Robust System Design
IOLTS 2022-28th IEEE International Symposium on OnLine Testing and Robust System Design, Sep 2022, Torino, Italy. pp.1-7
IOLTS 2022-28th IEEE International Symposium on OnLine Testing and Robust System Design
IOLTS 2022-28th IEEE International Symposium on OnLine Testing and Robust System Design, Sep 2022, Torino, Italy. pp.1-7
Paper accepted on 28th IEEE IOLTS 2022; International audience; RISC-V architectures have gained importance in the last years due to their flexibility and open-source Instruction Set Architecture (ISA), allowing developers to efficiently adopt RISC-V
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::38b327d12e6d3e9333a0473d93f0d29c
http://arxiv.org/abs/2206.08639
http://arxiv.org/abs/2206.08639
Publikováno v:
International Journal of Parallel Programming
International Journal of Parallel Programming, 2022, 50 (2), pp.267-294. ⟨10.1007/s10766-022-00724-7⟩
International Journal of Parallel Programming, 2022, 50 (2), pp.267-294. ⟨10.1007/s10766-022-00724-7⟩
International audience; On multicore platforms, reliable task execution, as well as low energy consumption, are essential. Dynamic Voltage/Frequency Scaling (DVFS) is typically used for energy savings, but with a negative impact on reliability, espec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::abf6f37f04e5e3e2ac419b365e94fe5d
https://inria.hal.science/hal-03907885/document
https://inria.hal.science/hal-03907885/document