Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Angelica Bacivarov"'
Publikováno v:
Advanced Topics in Optoelectronics, Microelectronics and Nanotechnologies X.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a2d1a01f578e291d24856708f99ac302
https://doi.org/10.1117/12.2573288
https://doi.org/10.1117/12.2573288
Publikováno v:
SPIE Proceedings.
This paper presents the new approach in the analysis of the Quality Management Systems (QMS) of companies, based on the revised standard ISO 9001:2015. In the first part of the paper, QMS based on ISO 9001 certification are introduced; the changes an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::598591d5ecc235cea274e6b1d59e59bf
https://doi.org/10.1117/12.2246030
https://doi.org/10.1117/12.2246030
Publikováno v:
SPIE Proceedings.
Dependability of electronic circuits can be ensured only through testing of circuit modules. This is done by generating test vectors and their application to the circuit. Testability should be viewed as a concerted effort to ensure maximum efficiency
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6c3024b3352bb6520dbd4127390810a5
https://doi.org/10.1117/12.2246109
https://doi.org/10.1117/12.2246109
Publikováno v:
SPIE Proceedings.
With the globalization of the markets and the growth of competitiveness in the manufacturing sector, quality has become a key factor of success. Quality is particularly important for the companies which activate in the micro(electronics) field. The q
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8f71be23d55a65f052f7e82e94405dce
https://doi.org/10.1117/12.882295
https://doi.org/10.1117/12.882295
Autor:
Alin Mihalache, Fabrice Guerin, Mihaela Barreau, Angelica Bacivarov, Alexis Todoskoff, Ioan C. Bacivarov
Publikováno v:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV.
Reliability estimation is becoming an important issue of the design process of complex heterogeneous systems. The concept of reliability is frequently seen as being one of the least controlled points and for some as being the critical point. Since th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c09e8f6bb41e193ce27f8dc243456d5e
https://doi.org/10.1117/12.823701
https://doi.org/10.1117/12.823701
Publikováno v:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV.
A strategy for the implementation of the Six Sigma method as an improvement solution for the ISO 9000:2000 Quality Standard is proposed. Our approach is focused on integrating the DMAIC cycle of the Six Sigma method with the PDCA process approach, hi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4c1e66b99abf3986b74fc25cd1041c99
https://doi.org/10.1117/12.823705
https://doi.org/10.1117/12.823705
Publikováno v:
SPIE Proceedings.
Traditional statistical process control (SPC) techniques applied in the industrial processes field consider often that the distribution ofdata is Gaussian. The estimation ofparameters, the detection ofthe out oforder situations and the control of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7ed2cd581070d77f6f090ba96b2817ff
https://doi.org/10.1117/12.741893
https://doi.org/10.1117/12.741893
Autor:
Angelica Bacivarov
Publikováno v:
SPIE Proceedings.
Drastic device shrinking, power supply reduction, and increasing operating speeds that accompany the technological evolution to deeper submicron, reduce significantly the noise margins and thus the reliability of deep submicron ICs. A more significan
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::503cc0b33871af7f2f17e7a88958f559
https://doi.org/10.1117/12.741873
https://doi.org/10.1117/12.741873
Autor:
Angelica Bacivarov
Publikováno v:
SPIE Proceedings.
Although higher reliability is expected from submicron and nanotechnology so far only a few attempts have been made to apply reliability theory to submicron and nanodevices. The way to reliable nanotechnology is to identify relevant physical failure
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::08b8254026280c3e0c7fff88c8262439
https://doi.org/10.1117/12.639773
https://doi.org/10.1117/12.639773