Zobrazeno 1 - 10
of 76
pro vyhledávání: '"Ang, G.B."'
Autor:
Neo, S.P., Quah, A.C.T., Ang, G.B., Nagalingam, D., Ma, H.H., Ting, S.L., Soo, C.W., Chen, C.Q., Mai, Z.H., Lam, J.C.
Publikováno v:
In Microelectronics Reliability September 2017 76-77:255-260
Autor:
Chen, C.Q., Ang, G.B., Ng, P.T., Rivai, Francis, Ng, H.P., Quah, A.C.T., Teo, Angela, Lam, Jeffery, Mai, Z.H.
Publikováno v:
In Microelectronics Reliability September 2017 76-77:261-266
Autor:
Chen, C.Q., Ang, G.B., Ng, P.T., Rivai, Francis, Neo, S.P., Nagalingam, D., Yip, K.H., Lam, Jeffery, Mai, Z.H.
Publikováno v:
In Microelectronics Reliability September 2017 76-77:141-144
Autor:
Quah, A.C.T., Nagalingam, D., Moon, S., Susanto, E., Ang, G.B., Neo, S.P., Lam, J.C., Mai, Z.H.
Publikováno v:
In Microelectronics Reliability June 2017 73:76-91
Publikováno v:
In Microelectronics Journal April 2017 62:38-42
Autor:
Chen, C.Q., Ng, P.T., Ang, G.B., T an, H., Rivai, Francis, Ma, Y.Z., Ng, H.P., Lam, Jeffery, Mai, Z.H.
Publikováno v:
In Microelectronics Reliability September 2016 64:317-320
Publikováno v:
Proceedings of the 20th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits (IPFA); 2013, p289-292, 4p
Publikováno v:
2008 15th International Symposium on the Physical & Failure Analysis of Integrated Circuits; 2008, p1-4, 4p
Publikováno v:
ICONIP '02. Proceedings of the 9th International Conference on Neural Information Processing. Computational Intelligence for the E-Age (IEEE Cat. No.02EX575); 2002, p22-26, 5p
Publikováno v:
Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548); 2001, p107-111, 5p