Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Andy Scheffel"'
Autor:
Katrin Wondraczek, Antje Kriltz, Claudia Aichele, Florian Lindner, Hartmut Bartelt, Andy Scheffel
Publikováno v:
Optical Materials Express. 12:184
For high power fiber lasers, codoping with Al, P or both is necessary to prevent rare earth (RE) clustering in the silica network of the laser active core material. Here, we present a complementary infrared (IR) based multispectral method combined wi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b80f43cc238b70af0cb4473bdfd06936
https://doi.org/10.1364/ome.444146
https://doi.org/10.1364/ome.444146
Autor:
Andy Scheffel, Ralf Methling, Volker Reichel, Rüdiger Foest, Hartmut Bartelt, Hardy Baierl, Jan Dellith, Margarita Baeva, Katrin Wondraczek, F. Hempel, Lothar Wondraczek, Daniel Köpp, T Trautvetter
Publikováno v:
Optical Components and Materials XVI.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1d0c069146214818c3fe6df703ac5d64
https://doi.org/10.1117/12.2507421
https://doi.org/10.1117/12.2507421
Publikováno v:
Optical Components and Materials XV.
In this paper we will discuss the influence of atmosphere pressure microwave plasma on the background loss and the radial distribution of several dopants in specialty, especially rare-earth (RE) doped, preforms and fibers for high power application.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::24c78577ab92569896f50dd0ecf21fe4
https://doi.org/10.1117/12.2286646
https://doi.org/10.1117/12.2286646
Publikováno v:
Microscopy and Microanalysis. 23:500-501
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8042c58c5891fe0fb3dc771e2c4b7969
https://doi.org/10.1017/s143192761700318x
https://doi.org/10.1017/s143192761700318x
Publikováno v:
Microchimica Acta. 155:269-274
The intensities of the Fe L lines/bands l = L3M1, η = L2M1, α1,2 = L3M4,5, β1 = L2M4, and β3,4 = L1M2,3 were measured for pure Fe and Fe3O4 using a TAP crystal as the dispersing element. The energy of the exciting electrons, E0, was varied in the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8c4d610d410c6a9cfbd786604cd8c827
https://doi.org/10.1007/s00604-006-0554-5
https://doi.org/10.1007/s00604-006-0554-5
Publikováno v:
Microchimica Acta. 161:471-473
The electron excited N-series lines N4N6 and N5N7 of the element 74W were studied using both energy dispersive (ED) and wavelength dispersive spectrometry. In ED spectra these lines appear as one unresolved peak N4,5N6,7 at approximately 217 eV. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c9025657a265fdd49725d4d6dc4b8f70
https://doi.org/10.1007/s00604-007-0876-y
https://doi.org/10.1007/s00604-007-0876-y
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 17(2)
The M spectrum of the element uranium was reinvestigated by using both high-resolution wavelength dispersive (WD) spectrometry as well as energy dispersive (ED) spectrometry. Thereby we observed relative intensities that deviate from data in the lite
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0f5d2a543ae34c307011bfe04d7542bf
https://pubmed.ncbi.nlm.nih.gov/21406137
https://pubmed.ncbi.nlm.nih.gov/21406137
Publikováno v:
Optical Materials Express. 4:672
The diffusion of titanium in TiO2-SiO2 glasses with up to 7 mol% TiO2 was investigated by annealing doped layers on the inner surface of quartz glass tubes between 1700 and 2000°C and measuring radial doping profiles via X-ray microprobe analysis an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f4433349d45f1ff343b81ec5af62319c
https://doi.org/10.1364/ome.4.000672
https://doi.org/10.1364/ome.4.000672
Publikováno v:
Optical Materials Express. 2:534
The diffusion of boron in yB2O3(1-y)SiO2 glasses with up to 8 mol% B2O3 was investigated by annealing doped layers on the inner surface of quartz glass tubes between 1700°C and 2000°C and measuring radial doping profiles by X-ray microprobe analysi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f61e2a1684d58bb98f772bfc30936ba1
https://doi.org/10.1364/ome.2.000534
https://doi.org/10.1364/ome.2.000534