Zobrazeno 1 - 10
of 40
pro vyhledávání: '"Andy Lan"'
Autor:
Zaid W. El-Husseini, Dmitry Khalenkow, Andy Lan, Thys van der Molen, Chris Brightling, Alberto Papi, Klaus F. Rabe, Salman Siddiqui, Dave Singh, Monica Kraft, Bianca Beghe, Maarten van den Berge, Djoke van Gosliga, Martijn C. Nawijn, Stefan Rose-John, Gerard H. Koppelman, Reinoud Gosens
Publikováno v:
Respiratory Research, Vol 24, Iss 1, Pp 1-12 (2023)
Abstract Background Asthma is stratified into type 2-high and type 2-low inflammatory phenotypes. Limited success has been achieved in developing drugs that target type 2-low inflammation. Previous studies have linked IL-6 signaling to severe asthma.
Externí odkaz:
https://doaj.org/article/e4d93162eadc447d86daca4b0d26e0df
Publikováno v:
Optical and EUV Nanolithography XXXVI.
Autor:
Binbin Yan, Miao Jiang, Futian Wang, Di Liang, Liang Li, Wei Feng, Joer Huang, Dajun Wu, Andy Lan, Jiangliu Shi
Publikováno v:
Metrology, Inspection, and Process Control XXXVII.
Frequency doubling and resolution enhancement technique exploration for chrome-less phase shift mask
Autor:
Liang Li, Miao Jiang, Di Liang, Binbin Yan, Feng Tian, Mingqi Gao, Dajun Wu, Andy Lan, Jiangliu Shi
Publikováno v:
2022 International Workshop on Advanced Patterning Solutions (IWAPS).
Publikováno v:
2022 International Workshop on Advanced Patterning Solutions (IWAPS).
Autor:
Binbin Yan, Miao Jiang, Di Liang, Liang Li, Wei Feng, Joer Huang, Dajun Wu, Andy Lan, Jiangliu Shi
Publikováno v:
2022 International Workshop on Advanced Patterning Solutions (IWAPS).
Autor:
Ethan Chiu, Mingqi Gao, feng Tian, Wei Feng, Andy Lan, Dan Li, Shengyuan zhong, Aijiao zhu, Ningqi Zhu, yunchen Xu, Jin Zhu, jincheng Pei, Kevin Huang
Publikováno v:
Metrology, Inspection, and Process Control XXXVI.
Autor:
Chieh-Chen Chiu, Feng Tian, Wei Feng, mingqi Gao, Andy Lan, Aijiao Zhu, Ningqi Zhu, Dan Li, Jin Zhu, jincheng Pei, Kevin Huang
Publikováno v:
Metrology, Inspection, and Process Control XXXVI.
Autor:
Chieh-Chen Chiu, Feng Tian, Wei Feng, Mingqi Gao, Andy Lan, chao-jen tsou, shengyuan zhong, Norman Birnstein, Robin Maximilian Zech, Clemens Utzny, Jin Zhu, jincheng pei, Kevin Huang
Publikováno v:
Metrology, Inspection, and Process Control XXXVI.
Autor:
Chieh-Chen Chiu, feng tian, wei feng, mingqi Gao, Andy lan, shengyuan zhong, chaojen tsou, ningqi zhu, Jin Zhu, jincheng pei, Kevin Huang
Publikováno v:
Metrology, Inspection, and Process Control XXXVI.