Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Andrzej GŁADKI"'
Publikováno v:
Image Analysis and Stereology, Vol 40, Iss 1, Pp 39-47 (2021)
Tomography allows embedding of one space in another, especially ℛ2 → ℛ3, and observation of the nature of the volumetric internal composite structure. Now, not only a simple interpretation is expected of geometry defined via single thresholds o
Externí odkaz:
https://doaj.org/article/6a3df1f3f55e4728b50f38ed14232c4c
Autor:
Katarzyna PIETRZAK, Krystyna FRYDMAN, Danuta WÓJCIK-GRZYBEK, Andrzej GŁADKI, Anna BAŃKOWSKA, Piotr BORKOWSKI
Publikováno v:
Medžiagotyra, Vol 24, Iss 1, Pp 69-74 (2018)
This paper presents the manufacturing method of silver based composite materials containing 3 % vol. carbon forms (nanotubes and graphene). The most significant challenge was to obtain good dispersion of carbon in the metallic matrix. The applying of
Externí odkaz:
https://doaj.org/article/df070f05ceb442cdb5cf9fa2bc9656e7
Autor:
P. Borkowski, Katarzyna Pietrzak, Anna Bańkowska, D. Wójcik-Grzybek, Andrzej Gładki, K. Frydman
Publikováno v:
Medžiagotyra, Vol 24, Iss 1, Pp 69-74 (2018)
This paper presents the manufacturing method of silver based composite materials containing 3 % vol. carbon forms (nanotubes and graphene). The most significant challenge was to obtain good dispersion of carbon in the metallic matrix. The applying of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::331617038cdc22a474f08128d67dbc93
https://doi.org/10.5755/j01.ms.24.1.17769
https://doi.org/10.5755/j01.ms.24.1.17769
Publikováno v:
Vacuum. 72:217-223
The surface quality is crucial for growth of epitaxial layers on III–V semiconductor substrates. In this work the procedures of epi-ready semi-insulating (SI) GaAs wafer preparation were developed. The atomic force microscopy (AFM), triple crystal
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e2553c3b5eeb5f012fedf80cf2f1691
https://doi.org/10.1016/s0042-207x(03)00143-x
https://doi.org/10.1016/s0042-207x(03)00143-x
Publikováno v:
Key Engineering Materials. :1085-1088
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e18704130c880c784127c87cf0170696
https://doi.org/10.4028/www.scientific.net/kem.206-213.1085
https://doi.org/10.4028/www.scientific.net/kem.206-213.1085
Publikováno v:
Key Engineering Materials. :1013-1016
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d151a609234a288591ed9bde74e9cbe9
https://doi.org/10.4028/www.scientific.net/kem.206-213.1013
https://doi.org/10.4028/www.scientific.net/kem.206-213.1013