Výsledky vyhledávání - "Andrey Yakshin"

Hysteresis, loss and nonlinearity in epitaxial PbZr0.55Ti0.45O3 films

Autor: Yorick A. Birkhölzer, Fred Bijkerk, Guus Rijnders, Evert Pieter Houwman, Mohammadreza Nematollahi, Philip Lucke, Muharrem Bayraktar, Andrey Yakshin

Publikováno v: Advanced Functional Materials, 30, 1-12
Advanced Functional Materials, 30, 52, pp. 1-12
Advanced functional materials, 30(52):2005397. Wiley-VCH Verlag

The phenomena of hysteresis, ferroelectric loss, and nonlinearity are investigated for the strain and polarization of a monoclinic, epitaxial Pb(Zr,Ti)O3 film over the 70 Hz to 5 kHz frequency range at sub-coercive excitation fields and zero electric

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::84e67f6bfb0f567f5a0b1b2c22a14bfe
http://www.scopus.com/inward/record.url?scp=85091375333&partnerID=8YFLogxK

Zobrazit plný text záznamu

W/B short period multilayer structures for soft x-rays

Autor: Andrey Yakshin, Andrey Zameshin, F. Bijkerk, Jacobus Marinus Sturm, Roman Medvedev

Publikováno v: AIP Advances, Vol 10, Iss 4, Pp 045305-045305-8 (2020)
AIP advances, 10(4):045305. American Institute of Physics

X-ray W/B multilayer mirrors with a period of 2.5 nm were deposited by dc magnetron sputtering and studied in comparison with W/Si multilayer systems of the same period. Transmission electron microscopy, grazing incidence X-Ray reflectivity, and x-ra

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::64bf9e52d20284f89550fbcfa504d95a
http://www.scopus.com/inward/record.url?scp=85083075591&partnerID=8YFLogxK

Zobrazit plný text záznamu

Double matrix effect in Low Energy Ion Scattering from La surfaces

Autor: Andrey Yakshin, Jacobus Marinus Sturm, Andrey Zameshin, Fred Bijkerk, Hidde H. Brongerma

Publikováno v: Applied surface science, 440, 570-579. Elsevier

Low Energy Ion Scattering (LEIS) has been performed on several lanthanum-based surfaces. Strong subsurface matrix effects – dependence of surface scattered He+ ion yield on the composition of subsurface layer – have been observed. The ion yield o

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::efc09330d2e2c39b1704c15c7a80e859
https://doi.org/10.1016/j.apsusc.2018.01.174

Zobrazit plný text záznamu

Nanoscale piezoelectric surface modulation for adaptive extreme ultraviolet and soft x-ray optics

Autor: Muharrem Bayraktar, Mohammadreza Nematollahi, Fred Bijkerk, Philip Lucke, Andrey Yakshin, Guus Rijnders

Publikováno v: Optics letters, 44(20), 5104-5107. The Optical Society

Extreme ultraviolet and soft x-ray wavelengths have ever-increasing applications in photolithography, imaging, and spectroscopy. Adaptive schemes for wavefront correction at such a short wavelength range have recently gained much attention. In this L

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c009a3245a9eefe2f94895ed5ce13001
https://pubmed.ncbi.nlm.nih.gov/31613275

Zobrazit plný text záznamu

Grazing-Incidence La/B-Based Multilayer Mirrors for 6.x nm Wavelength

Autor: Jacobus Marinus Sturm, Dmitry Kuznetsov, Andrey Yakshin, Frederik Bijkerk

Publikováno v: Journal of nanoscience and nanotechnology, 19(1), 585-592. American Scientific Publishers

We studied a possibility of fabricating LaN/B grazing incidence multilayer mirrors for 6.x nm radiation at a relatively large angle of incidence (AOI = 77° off-normal). LaN/B multilayers with a periodicity of 15 nm were successfully fabricated. But

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fec27fcbf409f0a55c4b270d55d4b721
https://research.utwente.nl/en/publications/f1ee62e3-b76d-44e3-9d1c-036dc4e80009

Zobrazit plný text záznamu

Angular and spectral bandwidth of Extreme UV multilayers near spacer material absorption edges

Autor: Anirudhan Chandrasekaran, Andrey Yakshin, Fred Bijkerk, Andrey Zameshin

Publikováno v: Journal of nanoscience and nanotechnology, 19(1), 602-608. American Scientific Publishers

High resolution imaging systems for EUV range are based on multilayer optics. Current generation of EUV lithography uses broadband Sn LPP sources, which requires broadband mirrors to fully utilize the source power. On the other hand, there always rem

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2ea8b6503c53c1f7e511f6c766b7dc71
https://research.utwente.nl/en/publications/angular-and-spectral-bandwidth-of-extreme-uv-multilayers-near-spacer-material-absorption-edges(ebd9fbfc-57d7-4e80-9444-971a56f314d9).html

Zobrazit plný text záznamu

Influence of DC Bias on the Hysteresis, Loss, and Nonlinearity of Epitaxial PbZr 0.55 Ti 0.45 O 3 Films

Autor: Muharrem Bayraktar, Philip Lucke, Evert Pieter Houwman, Guus Rijnders, Niels Schukkink, Andrey Yakshin, Fred Bijkerk

Publikováno v: Advanced electronic materials. Wiley-VCH Verlag
Advanced electronic materials, 7(8):2100115. Wiley-VCH Verlag

The hysteresis, loss, and nonlinearity of the strain and polarization response of an epitaxial PbZr0.55Ti0.45O3 film are experimentally investigated for non-switching AC excitation fields at a DC bias of 20 kV cm−1 in the 70 Hz to 5 kHz range. The

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e22e0cefac30cc4b8a96fe0834850884
https://doi.org/10.1002/aelm.202100115

Zobrazit plný text záznamu

Interface formation in W/Si multilayers studied by Low Energy Ion Scattering

Autor: Andrey Yakshin, Andrey Zameshin, F. Bijkerk, Roman Medvedev

Publikováno v: Thin solid films, 724:138569. Elsevier

We studied the formation of interfaces in W/Si multilayer structures deposited by magnetron sputtering. In vacuo Low Energy Ion Scattering Spectroscopy was used to determine the materials growth profile with a close to atomic resolution. For that pur

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a9bf48582a93a5923a3e32d15c53b22e
https://doi.org/10.1016/j.tsf.2021.138569

Zobrazit plný text záznamu

In situ and real-time monitoring of structure formation during non-reactive sputter deposition of lanthanum and reactive sputter deposition of lanthanum nitride

Autor: Fred Bijkerk, Bärbel Krause, Tilo Baumbach, Shyjumon Ibrahimkutty, Andrey Yakshin, Dmitry Kuznetsov

Publikováno v: Journal of applied crystallography, 51, 1013-1020. International Union of Crystallography
Journal of applied crystallography, 51 (4), 1013-1020
Journal of Applied Crystallography

A real-time synchrotron radiation study of the crystalline phase, texture formation and resulting surface roughness during deposition of thin La and LaN films is presented. For LaN, the theoretically predicted metastable wurtzite and zincblende struc

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0be2fa38236a34603e2350eb7c9c5c39
https://research.utwente.nl/en/publications/352728eb-7448-4e9b-a951-c659f03f36f3

Zobrazit plný text záznamu

In vacuo low-energy ions scattering studies of ZrO2 growth by magnetron sputtering

Autor: Marko Sturm, Roger Coloma Ribera, Robbert van de Kruijs, Andrey Yakshin, Fred Bijkerk

Publikováno v: In vacuo low-energy ions scattering studies of ZrO2 growth by magnetron sputtering
University of Twente Research Information (Pure Portal)

ZrO2 thin films have applications as dielectric or passivation layer in applications as CMOS gate dielectrics and Si solar cells. Furthermore, ZrO2 may be of interest as capping layer for protecting extreme ultraviolet (EUV) optics against chemical d

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::c2421afaef27186cab0ba53cea6a94b9
https://research.utwente.nl/en/publications/61ff3692-84d6-4b7f-8dcf-a13f7c1e7687

Zobrazit plný text záznamu

Vyhledávací nástroje:

Upřesnit hledání