Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Andrey Denisyuk"'
Publikováno v:
International Symposium for Testing and Failure Analysis.
A protocol for obtaining an advanced TEM lamella geometry using FIB-SEM is presented. Lamella lift-out procedure might require multiple manipulation steps or even breaking the vacuum in order to reach inverted or plan-view lamella geometries. We have
Publikováno v:
Microscopy and Microanalysis. 23:484-490
We report on the mitigation of curtaining artifacts during transmission electron microscopy (TEM) lamella preparation by means of a modified ion beam milling approach, which involves altering the incident angle of the Ga ions by rocking of the sample
Publikováno v:
Journal of Nanoscience and Nanotechnology. 12:8651-8655
We investigate optical properties of a new complex plasmonic nanostructure, which consists of a spherical metallic nanoshell and a small metallic nanoparticle ("nanoknob") situated on its surface. The plasmon resonance wavelength of the entire struct
Publikováno v:
Microscopy and Microanalysis. 22:56-57
Publikováno v:
Microscopy and Microanalysis. 22:196-197
Autor:
Tomáš Zikmund, Andrey Denisyuk, Rostislav Vana, S. Sharang, Dominika Kalasová, Jozef Kaiser, Jozef Vincenc Obona, Jiri Dluhos
Publikováno v:
Web of Science
Latest technology nodes have made finer, more precise physical failure analysis techniques to emerge. Conventional techniques for larger technology nodes are slowly becoming ineffective. In this paper, we discuss effective yet non-invasive technique
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9e760307ff4b62bca938feed1f6ef18a
https://publons.com/wos-op/publon/35664840/
https://publons.com/wos-op/publon/35664840/