Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Andrey A. Generalov"'
Autor:
Domantas Vizbaras, Kęstutis Ikamas, Sandra Pralgauskaitė, Jonas Matukas, Andrey A. Generalov, Alvydas Lisauskas
Publikováno v:
Vizbaras, D, Ikamas, K, Pralgauskaitė, S, Matukas, J, Generalov, A A & Lisauskas, A 2022, ' Optimization of terahertz detectors based on graphene field effect transistors by high impedance antennae ', Lithuanian Journal of Physics, vol. 62, no. 4, pp. 254-266 . https://doi.org/10.3952/physics.v62i4.4822
This contribution presents the results of investigations performed on monolayer graphene field effect transis-tor-based (GFET-based) terahertz detectors. We have implemented three different types of planar antennae: a bow-tie, a bow-tie with transmis
Autor:
Andrey A. Generalov, Florian Ludwig, Jakob Holstein, Anton Murros, Miika Soikkeli, Hartmut G. Roskos, Sanna Arpiainen
Publikováno v:
Generalov, A A, Ludwig, F, Holstein, J, Murros, A, Soikkeli, M, Roskos, H G & Arpiainen, S 2022, Graphene TeraFETs : Effect of gated channel region on THz performance . in IRMMW-THz 2022 : 47th International Conference on Infrared, Millimeter and Terahertz Waves . IEEE Institute of Electrical and Electronic Engineers, International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz, vol. 2022-August, 47th International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2022, Delft, Netherlands, 28/08/22 . https://doi.org/10.1109/IRMMW-THz50927.2022.9895901
We investigate the dependence of the responsivity of antenna-coupled graphene field-effect transistors (graphene TeraFETs) on the transistor's channel geometry. The graphene TeraFETs are fabricated using a wafer-scale CVD process, and the measurement
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::20da56d9bacd18424834311c5525fe15
https://cris.vtt.fi/en/publications/f74b0ec9-ec38-4567-a45f-c73479b42101
https://cris.vtt.fi/en/publications/f74b0ec9-ec38-4567-a45f-c73479b42101
Autor:
Mika Prunnila, Hartmut G. Roskos, Zhipei Sun, Mohsen Ahmadi, Jan Stake, Andrey A. Generalov, Marlene Bonmann, Andrei Vorobiev, Florian Ludwig, Sanna Arpiainen, Miika Soikkeli
Publikováno v:
Generalov, A A, Ludwig, F, Ahmadi, M, Bonmann, M, Vorobiev, A, Soikkeli, M, Arpiainen, S, Prunnila, M, Stake, J, Roskos, H G & Sun, Z 2020, Distinction of the thermoelectric effect in graphene FET THz detectors . in 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020 ., 9370957, IEEE Institute of Electrical and Electronic Engineers, International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz, vol. 2020-November, pp. 504-505, 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020, Buffalo, New York, United States, 8/11/20 . https://doi.org/10.1109/IRMMW-THz46771.2020.9370957
This work presents an approach to distinguish the thermoelectric detection mechanism from the resistive mixing or plasma wave rectification in graphene FET THz detectors. Numerical full-wave simulations validate the asymmetric feeding of the existing
Autor:
Feijoo PC; Universitat Autònoma de Barcelona 08193 Cerdanyola del Vallès Spain PedroCarlos.Feijoo@uab.cat., Pasadas F; Universitat Autònoma de Barcelona 08193 Cerdanyola del Vallès Spain PedroCarlos.Feijoo@uab.cat., Bonmann M; Chalmers University of Technology SE-41296 Gothenburg Sweden., Asad M; Chalmers University of Technology SE-41296 Gothenburg Sweden., Yang X; Chalmers University of Technology SE-41296 Gothenburg Sweden., Generalov A; Aalto University FI-00076 Helsinki Finland., Vorobiev A; Chalmers University of Technology SE-41296 Gothenburg Sweden., Banszerus L; 2nd Institute of Physics, RWTH Aachen University 52074 Aachen Germany., Stampfer C; 2nd Institute of Physics, RWTH Aachen University 52074 Aachen Germany., Otto M; Advanced Microelectronic Center Aachen, AMO GmbH 52074 Aachen Germany., Neumaier D; Advanced Microelectronic Center Aachen, AMO GmbH 52074 Aachen Germany., Stake J; Chalmers University of Technology SE-41296 Gothenburg Sweden., Jiménez D; Universitat Autònoma de Barcelona 08193 Cerdanyola del Vallès Spain PedroCarlos.Feijoo@uab.cat.
Publikováno v:
Nanoscale advances [Nanoscale Adv] 2020 Jul 24; Vol. 2 (9), pp. 4179-4186. Date of Electronic Publication: 2020 Jul 24 (Print Publication: 2020).
Autor:
Soltani A; Physikalisches Institut, Johann Wolfgang Goethe-Universität, Max-von-Laue-Str. 1, D-60438 Frankfurt am Main, Germany., Kuschewski F; Institut für Angewandte Physik, Technische Universität Dresden, Nöthnitzer Str. 61, D-01187 Dresden, Germany., Bonmann M; Department of Microtechnology and Nanoscience, Chalmers University of Technology, SE-41296 Gothenburg, Sweden., Generalov A; Department of Microtechnology and Nanoscience, Chalmers University of Technology, SE-41296 Gothenburg, Sweden.; Present Address: Department of Electronics and Nanoengineering, Aalto University, Tietotie 3, 02150, Espoo, Finland., Vorobiev A; Department of Microtechnology and Nanoscience, Chalmers University of Technology, SE-41296 Gothenburg, Sweden., Ludwig F; Physikalisches Institut, Johann Wolfgang Goethe-Universität, Max-von-Laue-Str. 1, D-60438 Frankfurt am Main, Germany., Wiecha MM; Physikalisches Institut, Johann Wolfgang Goethe-Universität, Max-von-Laue-Str. 1, D-60438 Frankfurt am Main, Germany., Čibiraitė D; Physikalisches Institut, Johann Wolfgang Goethe-Universität, Max-von-Laue-Str. 1, D-60438 Frankfurt am Main, Germany., Walla F; Physikalisches Institut, Johann Wolfgang Goethe-Universität, Max-von-Laue-Str. 1, D-60438 Frankfurt am Main, Germany., Winnerl S; Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, Bautzner Landstraße 400, D-01328 Dresden, Germany., Kehr SC; Institut für Angewandte Physik, Technische Universität Dresden, Nöthnitzer Str. 61, D-01187 Dresden, Germany., Eng LM; Institut für Angewandte Physik, Technische Universität Dresden, Nöthnitzer Str. 61, D-01187 Dresden, Germany.; Complexity and Topology in Quantum Matter (CT.QMAT), Cluster of Excellence EXC 2147, Dresden/Würzburg, Germany., Stake J; Department of Microtechnology and Nanoscience, Chalmers University of Technology, SE-41296 Gothenburg, Sweden., Roskos HG; Physikalisches Institut, Johann Wolfgang Goethe-Universität, Max-von-Laue-Str. 1, D-60438 Frankfurt am Main, Germany.
Publikováno v:
Light, science & applications [Light Sci Appl] 2020 Jun 04; Vol. 9, pp. 97. Date of Electronic Publication: 2020 Jun 04 (Print Publication: 2020).
Autor:
Smirnov S; Department of Micro and Nanosystems, KTH Royal Institute of Technology Malvinas Väg 10 SE-100 44 Stockholm Sweden dml@kth.se., Anoshkin IV; Department of Photonics and Optical Information Technologies, ITMO University 49 Kronverkskiy Pr. 197101 Saint Petersburg Russian Federation., Generalov A; Department of Electronics and Nanoengineering, Aalto University P. O. Box 13500 FI-00076 Finland., Lioubtchenko DV; Department of Micro and Nanosystems, KTH Royal Institute of Technology Malvinas Väg 10 SE-100 44 Stockholm Sweden dml@kth.se.; Center for Terahertz Research and Applications (CENTERA), Institute for High Pressure Physics, PAS 29/37 Sokołowska Str 01-142 Warsaw Poland., Oberhammer J; Department of Micro and Nanosystems, KTH Royal Institute of Technology Malvinas Väg 10 SE-100 44 Stockholm Sweden dml@kth.se.
Publikováno v:
RSC advances [RSC Adv] 2019 May 10; Vol. 9 (26), pp. 14677-14682. Date of Electronic Publication: 2019 May 10 (Print Publication: 2019).
Autor:
Krasnok A; Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78712, USA., Baranov DG; Department of Physics, Chalmers University of Technology, 412 96 Gothenburg, Sweden.; Moscow Institute of Physics and Technology, Dolgoprudny 141700, Russia., Generalov A; Department of Electronics and Nanoengineering, Aalto University, 02150 Espoo, Finland., Li S; ITMO University, St. Petersburg 197101, Russia., Alù A; Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, Texas 78712, USA.; Photonics Initiative, Advanced Science Research Center, City University of New York, New York 10031, USA.; Physics Program, Graduate Center, City University of New York, New York 10016, USA.; Department of Electrical Engineering, City College of The City University of New York, New York 10031, USA.
Publikováno v:
Physical review letters [Phys Rev Lett] 2018 Apr 06; Vol. 120 (14), pp. 143901.