Zobrazeno 1 - 10
of 53
pro vyhledávání: '"Andrew M. Gabor"'
Autor:
Andrew M. Gabor, Philip J. Knodle, Maurice Covino, Joseph Fioresi, Dylan J. Colvin, Kristopher O. Davis
Publikováno v:
IEEE Journal of Photovoltaics. 12:1308-1313
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::391e7620efb44274b02b295e8d8a1bf6
https://doi.org/10.1109/jphotov.2022.3206906
https://doi.org/10.1109/jphotov.2022.3206906
Autor:
Andrew Anselmo, Andrew M. Gabor, Geoffrey Gregory, Nafis Iqbal, Kristopher O. Davis, Haider Ali, Zhihao Yang, Mengjie Li
Publikováno v:
IEEE Journal of Photovoltaics. 9:1800-1805
The contact resistivity ( $\rho _c$ ) of screen-printed contacts is a significant component of series resistance in industrial solar cells. Measuring $\rho _c$ with standard techniques, such as the transmission line method (TLM), requires that the cu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a37baf0777de6d914fe53742e5b8d679
https://doi.org/10.1109/jphotov.2019.2945173
https://doi.org/10.1109/jphotov.2019.2945173
Autor:
Andrew M. Gabor, Adrienne L. Blum, Eric Schneller, Mohammad Jobayer Hossain, Zhihao Yang, Kristopher O. Davis, Steve Johnston, Geoffrey Gregory, Dana Sulas
Publikováno v:
IEEE Journal of Photovoltaics. 9:1350-1359
Novel, high-throughput metrology methods are used in this paper for detailed performance loss analysis of approximately 400 industrial crystalline silicon solar cells, all coming from the same production line. The characterization sequence combines t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0fe1ce486300abf7973c28e7bd54b474
https://doi.org/10.1109/jphotov.2019.2926628
https://doi.org/10.1109/jphotov.2019.2926628
Publikováno v:
2021 IEEE 48th Photovoltaic Specialists Conference (PVSC).
Electroluminescence images of modules obtained with InGaAs, scientific Si CMOS, cooled Si CCD, and DSLR CMOS camera technologies have been compared and analyzed. The quality of the images have been examined in terms of feature visibility. Calibrated
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7729bf4f6b2b047f87aabada605cf1df
https://doi.org/10.1109/pvsc43889.2021.9518826
https://doi.org/10.1109/pvsc43889.2021.9518826
Autor:
Philip Knodle, Andrew M. Gabor
Publikováno v:
2021 IEEE 48th Photovoltaic Specialists Conference (PVSC).
UV Fluorescence (UVF) is a relatively new "non-contact" method of detecting cracked cells in solar panels with potential high throughput and low cost. We report here on application of a pole-mount UV-flash camera system to the detection of defects on
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0878ed5952ce4964cdf144a262880211
https://doi.org/10.1109/pvsc43889.2021.9518884
https://doi.org/10.1109/pvsc43889.2021.9518884
Autor:
Kristopher O. Davis, Andrew M. Gabor, Eric Schneller, Michael Hopwood, Hubert Seigneur, Michael W. Rowell, Dylan J. Colvin
Publikováno v:
2020 47th IEEE Photovoltaic Specialists Conference (PVSC).
Solar panel degradation is usually assessed by the change in power at standard testing conditions (STC). However, some degradation mechanisms have shunting or recombination characteristics which have the potential to reduce performance at low irradia
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c326ebf200de1961d604b3c35213d6bf
https://doi.org/10.1109/pvsc45281.2020.9300743
https://doi.org/10.1109/pvsc45281.2020.9300743
Publikováno v:
Solar Energy. 151:163-172
The transmission line method (TLM) is often used in characterizing the contact resistance of c-Si solar cells by cutting cells into strips parallel to the busbars. When applying this method to industrial solar cells, we found various problems that ha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e2906ffbedab1f9104f329396fb19f6f
https://doi.org/10.1016/j.solener.2017.05.015
https://doi.org/10.1016/j.solener.2017.05.015
Autor:
Ranajay Ghosh, Hubert Seigneur, Victor Huayamave, Hossein Ebrahimi, Andrew M. Gabor, Eric Schneller, Michael W. Rowell, Jason Lincoln
Publikováno v:
2019 IEEE 46th Photovoltaic Specialists Conference (PVSC).
A single brief exposure of a photovoltaic (PV) module or coupon to cold temperatures down to -40°C, the lower limit in IEC photovoltaic testing standards, significantly degrades the fracture strength of silicon solar cells. To understand the mechani
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f454b719f1da8a5c6677ea12a8b771b0
https://doi.org/10.1109/pvsc40753.2019.9198968
https://doi.org/10.1109/pvsc40753.2019.9198968
Autor:
Andrew M. Gabor, Eric Schneller, Michael W. Rowell, Andrew Anselmo, Rob Janoch, Duncan Harwood, Hubert Seigneur, Jason Lincoln
Publikováno v:
2019 IEEE 46th Photovoltaic Specialists Conference (PVSC).
Solar panels generally contact the mounting structure only along the surfaces of the aluminum frame surrounding the perimeter of the panel. With no support in the middle of the panel, front side mechanical loads from snow, wind, and human factors can
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::130e605edde84594d48fd35b71071da0
https://doi.org/10.1109/pvsc40753.2019.8981256
https://doi.org/10.1109/pvsc40753.2019.8981256
Publikováno v:
2019 IEEE 46th Photovoltaic Specialists Conference (PVSC).
Existing mechanical durability testing sequences typically perform mechanical loading prior to environmental exposures such as thermal cycling or humidity freeze. Recent work has shown that the fracture strength of silicon solar cells can reduce afte
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ce3ee10f29124e25d03b132af062202d
https://doi.org/10.1109/pvsc40753.2019.8980533
https://doi.org/10.1109/pvsc40753.2019.8980533