Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Andrew Giordani"'
Autor:
Dane Morgan, Jie Deng, Izabela Szlufarska, Andrew Giordani, Kumar Sridharan, Bin Leng, Hyunseok Ko, Jerry L. Hunter, Tyler J. Gerczak
Publikováno v:
Journal of Nuclear Materials. 471:220-232
Transport of Ag fission product through the silicon-carbide (SiC) diffusion barrier layer in TRISO fuel particles is of considerable interest given the application of this fuel type in high temperature gas-cooled reactor (HTGR) and other future react
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2fc6aadafd8c9614540fc7df09aad1ba
https://doi.org/10.1016/j.jnucmat.2015.11.017
https://doi.org/10.1016/j.jnucmat.2015.11.017
Publikováno v:
Microscopy and Microanalysis. 26:2996-2996
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6f6ac088203248d325f9d9807381b94e
https://doi.org/10.1017/s1431927620023466
https://doi.org/10.1017/s1431927620023466
Publikováno v:
Journal of Nuclear Materials. 461:314-324
The nature and magnitude of Ag diffusion in SiC has been a topic of interest in connection with the performance of tristructural isotropic (TRISO) coated particle fuel for high temperature gas-cooled nuclear reactors. Ion implantation diffusion coupl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d93fcbe7d07ec4de3791a0265ece8914
https://doi.org/10.1016/j.jnucmat.2015.03.027
https://doi.org/10.1016/j.jnucmat.2015.03.027
Publikováno v:
Surface and Interface Analysis. 46:31-34
The ability to control and accurately measure the cesium concentration, [Cs], is a critical step toward understanding the role of Cs in the SIMS MCs+ technique. We have developed a method to alter the instantaneous [Cs] by using electron gun heating
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::286f0183b404f055d9b3c76f6df15cb6
https://doi.org/10.1002/sia.5652
https://doi.org/10.1002/sia.5652
Publikováno v:
Surface and Interface Analysis. 46:43-45
The evolution of cesium droplets on silicon by Cs ion bombardment has been studied. For this work, a (100) Si substrate was sputtered with a 5 keV Cs+ primary ion beam at 45° until steady state was established. The evolution of Cs droplets was inves
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::03f8c252170430f7081fcb55fe0a8ce6
https://doi.org/10.1002/sia.5657
https://doi.org/10.1002/sia.5657
Publikováno v:
Surface and Interface Analysis. 46:291-293
A Secondary Ion Mass Spectrometry (SIMS) method has been developed to measure stable Mg isotope tracer diffusion. This SIMS method was then used to calculate Mg self- diffusivities and the data was verified against historical data measured using radi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5e0795e35d57607e7e0500391a8fc914
https://doi.org/10.1002/sia.5618
https://doi.org/10.1002/sia.5618
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 34:051404
The retention of 1 and 5 keV Ar implanted at 45° in Si and 4.3 nm SiO2 on Si was studied at fluences between 3 × 1014 and 1.5 × 1016 cm−2. X-ray photoelectron spectroscopy (XPS) served to monitor the accumulation of Ar as well as the removal of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8dbe3fb690171a40fe143c41ec4875e7
https://doi.org/10.1116/1.4961574
https://doi.org/10.1116/1.4961574
Publikováno v:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 34:03H123
Combining Cs+ bombardment with positive secondary molecular ion detection (MCs+) can extend the analysis capability of secondary ion mass spectrometry (SIMS) from the dilute limit (
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1672a32adfec901e2399ce7fb7ff5ac6
https://doi.org/10.1116/1.4943159
https://doi.org/10.1116/1.4943159
Publikováno v:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 34:03H112
The authors have built, designed, and implemented a variable temperature stage for a Cameca IMS 7f-GEO with an achievable temperature range of −150 to 300 °C and designed a new sample holder for rapid thermal stabilization. This paper focuses on t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f919a35d9e0fba0443a83e7a04ede8ec
https://doi.org/10.1116/1.4941785
https://doi.org/10.1116/1.4941785