Zobrazeno 1 - 10
of 29
pro vyhledávání: '"Andreas Thust"'
Publikováno v:
Journal of large-scale research facilities JLSRF, Vol 2, p A41 (2016)
The FEI Titan 80-300 TEM is a high-resolution transmission electron microscope equipped with a field emission gun and a corrector for the spherical aberration (CS) of the imaging lens system. The instrument is designed for the investigation of a wide
Externí odkaz:
https://doaj.org/article/83cf904dca4e4305a7f8b617de2d30af
Autor:
Knut W. Urban, Juri Barthel, Lothar Houben, Chun-Lin Jia, Lei Jin, Markus Lentzen, Shao-Bo Mi, Andreas Thust, Karsten Tillmann
Publikováno v:
Progress in materials science 133, 101037-(2023). doi:10.1016/j.pmatsci.2022.101037
Transmission electron microscopy is an indispensable tool in modern materials science. It enables the structure of materials to be studied with high spatial resolution, and thus makes a decisive contribution to the fact that it is now possible to und
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e2f95a7f23721a09b3655fe81596016a
https://doi.org/10.1016/j.pmatsci.2022.101037
https://doi.org/10.1016/j.pmatsci.2022.101037
Autor:
Shao-Bo Mi, Juri Barthel, Knut Urban, Rafal E. Dunin-Borkowski, Andreas Thust, Chun-Lin Jia, Dawei Wang
Publikováno v:
Nature Materials. 13:1044-1049
Although the overall atomic structure of a nanoscale crystal is in principle accessible by modern transmission electron microscopy, the precise determination of its surface structure is an intricate problem. Here, we show that aberration-corrected tr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4c71d7c10b1d6518d799c35bd83bfbef
https://doi.org/10.1038/nmat4087
https://doi.org/10.1038/nmat4087
Publikováno v:
Microscopy and Microanalysis. 20:968-973
In low-energy electron microscopy (LEEM) we commonly encounter images which, beside amplitude contrast, also show signatures of phase contrast. The images are usually interpreted by following the evolution of the contrast during the experiment, and a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6a04a6922c39f4c8069120e596fb7258
https://doi.org/10.1017/s1431927614000403
https://doi.org/10.1017/s1431927614000403
Publikováno v:
Ultramicroscopy. 176
We investigate a possible dependence between the applied electron dose-rate and the magnitude of the resulting image contrast in HRTEM of inorganic crystalline objects. The present study is focussed on the question whether electron irradiation can in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b16be46b8af41975fb7e168026549dd0
https://pubmed.ncbi.nlm.nih.gov/27923513
https://pubmed.ncbi.nlm.nih.gov/27923513
Autor:
Michael A. O'Keefe, Andreas Thust, C. J. D. Hetherington, R. Kilaas, Yang Wang, Christian Kisielowski
It is reported that lattice imaging with a 300 kV field emission microscope in combination with numerical reconstruction procedures can be used to reach an interpretable resolution of about 80 pm for the first time. A retrieval of the electron exit w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a66f99735f7b2834423b2f4cf1030655
https://ora.ox.ac.uk/objects/uuid:24edc6d0-33e3-4b97-8775-5087f165e40e
https://ora.ox.ac.uk/objects/uuid:24edc6d0-33e3-4b97-8775-5087f165e40e
Publikováno v:
Microscopy and microanalysis 22(S3), 1390-1391 (2016). doi:10.1017/S1431927616007790
The comparison of absolute image intensities between experiment and simulation in high-resolutiontransmission electron microscopy (HRTEM) is a long-standing problem, which led to a multitude ofdiscussions and speculations in the past. A huge contrast
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4b7963d34d8ead36e9556fcbbcb2ca2b
https://hdl.handle.net/2128/19355
https://hdl.handle.net/2128/19355
Autor:
Andreas Thust
Publikováno v:
Transmission Electron Microscopy ISBN: 9783319266497
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a7d91e91fa3916e2303a1434df8610f6
https://doi.org/10.1007/978-3-319-26651-0_9
https://doi.org/10.1007/978-3-319-26651-0_9
Autor:
Juri Barthel, Andreas Thust
Publikováno v:
Ultramicroscopy. 111:27-46
The precise characterisation of the instrumental imaging properties in the form of aberration parameters constitutes an almost universal necessity in quantitative HRTEM, and is underlying most hardware and software techniques established in this fiel
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e784755620fe6c51134113df2a592300
https://doi.org/10.1016/j.ultramic.2010.09.007
https://doi.org/10.1016/j.ultramic.2010.09.007
Publikováno v:
Microscopy and Microanalysis. 11:534-544
The structural properties of β-phase tantalum nanocrystallites prepared by room temperature magnetron sputter deposition on amorphous carbon substrates are investigated at atomic resolution. For these purposes spherical aberration-corrected high-res
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f89569bd144b3cf8db2a26eb3d6f0c11
https://doi.org/10.1017/s1431927605050543
https://doi.org/10.1017/s1431927605050543