Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Andre A. Pugachev"'
Publikováno v:
SPIE Proceedings.
Mixed modeling of photosensitive CCD-features is given. The modeling includes simulation of the following design stages: 2D-fabrication process, 2D-potential and electric field distributions and wells providing desired characteristics of the CCD pixe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ddad0b0ad4a5e59fe121d17ef1fb4e6
https://doi.org/10.1117/12.463470
https://doi.org/10.1117/12.463470
Publikováno v:
SPIE Proceedings.
A new class of charge-coupled devices called junction virtual phase (JVP) CCD's is described. JVP CCDs have very high photosensitivity because their pixels are designed without any metal or polysilicon gates. A new principle of buried channel modulat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9d9ea7f609ae0d2f01068acbb460f4cb
https://doi.org/10.1117/12.238217
https://doi.org/10.1117/12.238217
Autor:
Victor A. Shilin, Andre A. Pugachev
Publikováno v:
SPIE Proceedings.
A software for simulation of CCD solid-state imagers has been designed. The software consist of simulators for imager process modeling, two and one dimensional charge and potential distribution modeling and simulators for modeling of main characteris
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1aaac5412ebc4f71f183186dcda77b6d
https://doi.org/10.1117/12.238201
https://doi.org/10.1117/12.238201
Autor:
Victor A. Shilin, Vjacheslav V. Kolotkov, Alexandre I. Baklanov, Andre A. Pugachev, Anatoli V. El'tsov
Publikováno v:
SPIE Proceedings.
Star sensor have special performance which allows to monitor point images for low illumination levels. For the CCD sensor, this means that all of the charge generated by image photons incident on a given pixel should be collected within that pixel. T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2c72da7cdd584d19cdcaee1f29ea0175
https://doi.org/10.1117/12.238218
https://doi.org/10.1117/12.238218
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Conference
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