Zobrazeno 1 - 10
of 38
pro vyhledávání: '"André Ivanov"'
Autor:
S. Arash Sheikholeslam, Jon López-Zorrilla, Hegoi Manzano, Saamaan Pourtavakoli, André Ivanov
Publikováno v:
ACS Omega, Vol 6, Iss 43, Pp 28561-28568 (2021)
Externí odkaz:
https://doaj.org/article/87d00cf382944d87a493b92717e7de0a
Publikováno v:
ACM Transactions on Design Automation of Electronic Systems.
Routing congestion is one of the many factors that need to be minimized during the physical design phase of large integrated circuits. In this paper, we propose a novel congestion estimation method, called MEDUSA, that consists of three parts: 1) a f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a1fbceff0759f216ecf061b89b0b2776
https://doi.org/10.1145/3590768
https://doi.org/10.1145/3590768
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 12:1068-1074
Aliasing is studied for delay and stuck-open faults. It is shown that, as the test sequence length is increased, the probability of aliasing for such faults tend to 2/sup -k/, where k is the number of binary memory elements in a linear compactor. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7444c1af1609dd831ec215aeae9f18d0
https://doi.org/10.1109/43.238044
https://doi.org/10.1109/43.238044
Publikováno v:
IEEE Transactions on Computers. 42:228-234
Many results regarding the probability of aliasing for multiple-input compactors have been derived under error assumptions that are not very realistic for VLSI circuits. Recently, the value of aliasing probability has been proven to tend to 2/sup -k/
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1808f6590bbd8599d642640d07c4c8ba
https://doi.org/10.1109/12.204795
https://doi.org/10.1109/12.204795
Autor:
André Ivanov, Slawomir Pilarski
Publikováno v:
Integration. 13:17-38
Built-in self-test (BIST) is emerging as one of the most promising solutions for testing large and complex integrated circuits. In BIST, high test quality is generally achieved by applying a large number of test patterns to the circuit under test. Th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0ce8ef046f9434c23c321da0aa55bb8a
https://doi.org/10.1016/0167-9260(92)90016-r
https://doi.org/10.1016/0167-9260(92)90016-r
Autor:
André Ivanov, Y. Wu
Publikováno v:
Microelectronics Journal. 23:205-214
The approach of checking multiple signatures has recently received attention because of the associated advantages of small aliasing, easy computation of fault coverage, shorter average test time, and increased fault diagnosability. In this paper we p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8e48767b801a4f02dd9cde517c7ddf81
https://doi.org/10.1016/0026-2692(92)90012-p
https://doi.org/10.1016/0026-2692(92)90012-p
Autor:
Yervant Zorian, André Ivanov
Publikováno v:
IEEE Transactions on Computers. 41:646-653
A built-in self-test (BIST) scheme for ROMs that has very high fault coverage and very small likelihood of error escape (aliasing) is described. For test generation, the scheme uses the exhaustive test technique. For output data evaluation the scheme
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4caae1f5cae60d378b4894d575a6fb8
https://doi.org/10.1109/12.142691
https://doi.org/10.1109/12.142691
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 11:16-25
Recent predictions about the aliasing behavior of linear feedback shift registers used in signature analysis with pseudorandom testing are validated experimentally. It is shown that the independent error model accurately predicts aliasing in these si
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::400d0a24bf887fc7fe51c6bdceeb9e2c
https://doi.org/10.1109/43.108615
https://doi.org/10.1109/43.108615
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 10:260-265
An algorithm, ALG-MK, for computing exact aliasing probabilities in signature analysis is derived from a Markov process model of signature analysis. A previous algorithm, ALG-BL, which was derived from a Boolean expressions formulation of the problem
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::07acf2e993d96a04fad06102cacd54b5
https://doi.org/10.1109/43.68413
https://doi.org/10.1109/43.68413
Autor:
V.K. Agarwal, André Ivanov
Publikováno v:
FTCS
An iterative technique for computing the exact probability of aliasing for any linear feedback signature register (i.e. characterized by any feedback polynomial, for any constant probability of error, and for any test length) is proposed. The techniq
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::10ad4773f163a5b8d7bbb4cdef572847
https://doi.org/10.1109/ftcs.1988.5299
https://doi.org/10.1109/ftcs.1988.5299