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Publikováno v:
Applied optics. 50(12)
Spectral domain phase microscopy (SDPM) has been reported in the literature as a functional extension to low-coherence interferometry, which enables nanoscale measurement of a scatter’s displacement. The signal in SDPM is generated from structural
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e161c44b69c3537e99c0b97c9f086390
https://pubmed.ncbi.nlm.nih.gov/21509074
https://pubmed.ncbi.nlm.nih.gov/21509074
