Zobrazeno 1 - 10
of 64
pro vyhledávání: '"Andi Buzo"'
Autor:
Alecsandra Rusu, Emilian David, Vasile Grosu, Marina Topa, Andi Buzo, Bianca Carbunescu, Georg Pelz
Publikováno v:
IEEE Access, Vol 12, Pp 136436-136450 (2024)
This paper presents an adaptive pre-silicon integrated circuit verification algorithm that incorporates a machine learning algorithm. This approach can overcome the traditional corner-based process-voltage-temperature verification limitations conside
Externí odkaz:
https://doaj.org/article/09a7adbb39e44090994795f77cd37254
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6314b49858b5b9cf327f0871fa872464
https://doi.org/10.1109/tcad.2021.3054804
https://doi.org/10.1109/tcad.2021.3054804
Autor:
Octavian Pascu, Catalin Visan, Marius Stanescu, Horia Cucu, Cristian Diaconu, Andi Buzo, Georg Pelz
Publikováno v:
2022 International Semiconductor Conference (CAS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3acd1208e070f27ae24b69823b954884
https://doi.org/10.1109/cas56377.2022.9934178
https://doi.org/10.1109/cas56377.2022.9934178
Publikováno v:
2022 International Semiconductor Conference (CAS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cb08834eb980456af55e916f8b6c0fcb
https://doi.org/10.1109/cas56377.2022.9934364
https://doi.org/10.1109/cas56377.2022.9934364
Publikováno v:
2022 IEEE International Test Conference India (ITC India).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::060a1dc18b1ba3cc683221f078efdeae
https://doi.org/10.1109/itcindia202255192.2022.9854542
https://doi.org/10.1109/itcindia202255192.2022.9854542
Autor:
Cristian Manolache, Alexandru Caranica, Marius Stanescu, Horia Cucu, Andi Buzo, Cristian Diaconu, Georg Pelz
Publikováno v:
2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::182fe25f3fef7f460a7932bb4278046c
https://doi.org/10.1109/smacd55068.2022.9816209
https://doi.org/10.1109/smacd55068.2022.9816209
Publikováno v:
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cbdcb90c0e5d26ee4daeb0d967073c8f
https://doi.org/10.1109/edtm53872.2022.9798263
https://doi.org/10.1109/edtm53872.2022.9798263
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 19:654-663
The paper proposes a methodology for estimation of the variation of power devices lifetime using data from different stages of development and tests. In the characterization process of power devices, the estimation of the minimum lifetime is not a si
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eb542f96f9232fa8b05baefa854f405b
https://doi.org/10.1109/tdmr.2019.2940672
https://doi.org/10.1109/tdmr.2019.2940672
Autor:
Cătălin Vişan, Octavian Pascu, Marius Stănescu, Elena-Diana Şandru, Cristian Diaconu, Andi Buzo, Georg Pelz, Horia Cucu
Publikováno v:
Knowledge-Based Systems. 258:109987
With the ever increasing complexity of specifications, manual sizing for analog circuits recently became very challenging. Especially for innovative, large-scale circuits designs, with tens of design variables, operating conditions and conflicting ob
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6d021ab7f121474e4126a4455ef9a37d
https://doi.org/10.1016/j.knosys.2022.109987
https://doi.org/10.1016/j.knosys.2022.109987
Publikováno v:
2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9bf87474f278111da457edf967e567de
https://doi.org/10.1109/icecs53924.2021.9665466
https://doi.org/10.1109/icecs53924.2021.9665466