Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Anderson S. Jesus"'
Autor:
Lucas A. da Silva, Eulanda M. dos Santos, Leo Araújo, Natalia S. Freire, Max Vasconcelos, Rafael Giusti, David Ferreira, Anderson S. Jesus, Agemilson Pimentel, Caio F. S. Cruz, Ruan J. S. Belem, André S. Costa, Osmar A. da Silva
Publikováno v:
Applied Sciences, Vol 11, Iss 22, p 10861 (2021)
Data-driven methods—particularly machine learning techniques—are expected to play a key role in the headway of Industry 4.0. One increasingly popular application in this context is when anomaly detection is employed to test manufactured goods in
Externí odkaz:
https://doaj.org/article/767bfa1dee5a46788481ad3eea69f2e1
Autor:
Eulanda M. Santos, Caio F.S. Cruz, Alexandre M. Uchoa, Andre S. Costa, Lucas G.C. Evangelista, Ruan J.S. Belem, Agemilson Pimentel, Anderson S. Jesus, Osmar A. da Silva, Rafael Giusti, Luciana R. Costa
Publikováno v:
ICCE-TW
We investigate using signal detection techniques for testing the audio capability of television sets in an industrial production line with the objective of identifying defectives devices. Two approaches were investigated in this study: the first was
Autor:
Luciana R. Costa, Caio F.S. Cruz, Celso B. Carvalho, Mateus O. Da Silva, Ruan J.S. Belem, Agemilson P. Silva, Edma V.C. Urtiga Mattos, Wilson C. C. Junior, Antonio M.C. Pereira, Ricardo G. Paula, Waldir S. S. Junior, Victor L. G. Cavalcante, Anderson S. Jesus, Kethilen Y. Ouchi, Thiago Brito Bezerra, David Alan de Oliveira Ferreira, Gustavo M. Torres
Publikováno v:
ICCE
Bright pixel defect occurs in LCDs when a transistor of a subpixel remains bright. Bright pixels reduce the quality of manufactured devices, negatively impacting companies looking to meet an increasingly demanding market. In this wokr, conducted by t
Autor:
Caio F.S. Cruz, Eddie Filho, Lucas Coimbra, Ricardo G. Paula, Ruan J.S. Belem, Anderson S. Jesus, Osmar R.A. Silva, André Lucirton Costa, Wilson Salgado Júnior, Agemilson Pimentel
Publikováno v:
ICCE-TW
In production lines for monitors and displays, some validation tests are based on visual inspection, whose preliminary step usually consists in detecting the area corresponding to a monitor's screen, which is then followed by evaluation procedures. N
Autor:
Anderson S. Jesus, Diego A. Amoedo, Ruan J.S. Belem, Luciana R. Costa, Victor L. G. Cavalcante, Lucas G.C. Evangelista, Ricardo G. Paula, Thiago Brito Bezerra, Celso B. Carvalho, Adriana S. Souza, Waldir S. S. Junior, Caio F.S. Cruz, Osmar R.A. Silva, Myke D. M. Valadao, Agemilson P. Silva
Publikováno v:
ICCE-TW
In this work, conducted by three partners (UFAM/CETELI, ICTS and ENVISION/TPV), we propose an automated dead/bright pixel distance measurement system for use on monitors and TVs screen. The proposed system use Homography transformation and proportion
Autor:
Osmar R.A. Silva, Celso B. Carvalho, Kethilen Y. Ouchi, Mateus O. Da Silva, Andre S. Costa, Adriana S. Souza, Antonio M.C. Pereira, Caio F.S. Cruz, Thiago Brito Bezerra, Anderson S. Jesus, Ruan J.S. Belem, Waldir S. S. Junior, Diego A. Amoedo, Luciana R. Costa, Lucas G.C. Evangelista, David Alan de Oliveira Ferreira, Myke D. M. Valadao, Gustavo M. Torres, Agemilson P. Silva
Publikováno v:
ICCE-TW
Manufacturing TVs and monitors requires an effective method to detect the dead pixels. These defects are usually identified by operators manually. However, manual inspection is susceptible to failure due to human fatigue and generate a high cost for
Autor:
Andre S. Costa, Ruan J.S. Belem, Eulanda Miranda dos Santos, Max Vasconcelos, Osmar A. da Silva, Leo Araújo, Caio F.S. Cruz, David Alan de Oliveira Ferreira, Natalia de Sousa Freire, Lucas A. da Silva, Anderson S. Jesus, Rafael Giusti, Agemilson Pimentel
Publikováno v:
Applied Sciences, Vol 11, Iss 10861, p 10861 (2021)
Applied Sciences
Volume 11
Issue 22
Applied Sciences
Volume 11
Issue 22
Data-driven methods—particularly machine learning techniques—are expected to play a key role in the headway of Industry 4.0. One increasingly popular application in this context is when anomaly detection is employed to test manufactured goods in
Autor:
Rebeca Rodrigues, Eddie Filho, Wheidima Carneiro de Melo, Anderson S. Jesus, Waldir S. S. Junior, Adolpho Ferreira, Victor Valente
Publikováno v:
Anais de XXXV Simpósio Brasileiro de Telecomunicações e Processamento de Sinais.