Zobrazeno 1 - 10
of 129
pro vyhledávání: '"Anatoly G. Yagola"'
Autor:
Zhijing Bai, Yanfei Wang, Chenzhang Wang, Caixia Yu, Dmitry Lukyanenko, Inna Stepanova, Anatoly G. Yagola
Publikováno v:
Remote Sensing, Vol 16, Iss 7, p 1115 (2024)
Enhancing the reliability of inversion results has always been a prominent issue in the field of geophysics. In recent years, data-driven inversion methods leveraging deep neural networks (DNNs) have gained prominence for their ability to address non
Externí odkaz:
https://doaj.org/article/5ac22cc2a2d841cc91faa1aa0554a088
Autor:
E. V. Sherstnev, V. Y. Karaulov, Dmitry Lukyanenko, E. I. Rau, Anatoly G. Yagola, S. V. Zaitsev, V. V. Zabrodsky, A. A. Borzunov
Publikováno v:
Moscow University Physics Bulletin. 76:209-214
An experimental system for detection of back-scattered electrons (BSE) in the scanning electron microscope (SEM) for three-dimensional (3D) visualization of the microstructure topography is described. The 3D surface topography reconstruction is carri
Publikováno v:
Journal of Inverse and Ill-posed Problems. 30:23-34
A fast algorithm for calculating the gradient of the Tikhonov functional is proposed for solving inverse coefficient problems for linear partial differential equations of a general form by the regularization method. The algorithm is designed for prob
Publikováno v:
Journal of Inverse and Ill-posed Problems. 29:753-758
A new technique for three-dimensional surface reconstruction of relatively smooth surface topography using the scanning electron microscopy with backscattered electron detector is considered. Experiments show high effectiveness of the method.
Autor:
Igor V. Kochikov, Anatoly G. Yagola, Alexander V. Tikhonravov, Dmitry Lukyanenko, A. A. Lagutina, Yu. S. Lagutin
Publikováno v:
Computational Mathematics and Mathematical Physics. 60:2056-2063
For optical monitoring of layer thickness in the deposition of multilayer optical coatings, a stable method is proposed that completely eliminates the cumulative effect of errors in the thicknesses of deposited layers. The considered monitoring metho
Autor:
A. A. Lagutina, Igor V. Kochikov, I. S. Lagutin, Alexander V. Tikhonravov, Anatoly G. Yagola, Dmitry Lukyanenko, S.A. Sharapova
Publikováno v:
Moscow University Physics Bulletin. 75:578-584
The paper presents a theoretical study of the correlation of errors in the thickness of layers of multilayer optical coatings produced using monochromatic monitoring of the deposition process. Estimates of the degree of error correlation in layer thi
Publikováno v:
Journal of Applied and Industrial Mathematics. 14:802-810
Under consideration is the problem of improving the contrast of the image obtained by processing tomographic projections with phase distortion. The study is based on the well-known intensity transfer equation. Unlike other works, this equation is sol
Publikováno v:
Journal of Inverse and Ill-posed Problems. 28:915-921
On-line optical monitoring of multilayer coating production requires solving inverse identification problems of determining the thicknesses of coating layers. Regardless of the algorithm used to solve inverse problems, the errors in the thicknesses o
Publikováno v:
Inverse Problems in Science and Engineering. 29:1055-1069
We study the three-dimensional inverse problem of elastography, that is finding the Young's modulus of a biological tissue from known values of its vertical displacements. In this way, one can find...
Publikováno v:
Computational Mathematics and Mathematical Physics. 60:1017-1024
A new computational approach is developed to evaluate the strength of the error self-compensation effect in the case of broadband optical monitoring of the multilayer coating deposition process. A new form of estimating the strength of the error self