Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Anand N. Iyer"'
Autor:
Richard A. Gray, Anand N. Iyer
Publikováno v:
Annals of Biomedical Engineering. 29:47-59
A phase variable that uniquely represents the time course of the action potential has been used to study the mechanisms of cardiac fibrillation. A spatial phase singularity (PS) occurs during reentrant wave propagation and represents the organizing c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::28dba56829f156e0b02e7ce8b2e39e38
https://doi.org/10.1114/1.1335538
https://doi.org/10.1114/1.1335538
Autor:
Garlen C. Leung, Christopher Heung-Gyun Lee, Sean Cui, Thomas H. Osterheld, Balaji Chandrasekaran, Lakshmanan Karuppiah, Anand N. Iyer, Jie Diao, Jun Qian
Publikováno v:
2010 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
The extension of Moore's Law at the 45/32nm nodes is made possible by the introduction of high-k metal gate. In the gate-last scheme to integrate high-k metal gate, planarization and surface topography control have been reported as some of the bigges
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8216c01421a5792b8a11c43859c2081d
https://doi.org/10.1109/asmc.2010.5551458
https://doi.org/10.1109/asmc.2010.5551458
Autor:
Antonella Martin, Peter McKeever, Francesca Frigerio, Anand N. Iyer, Maurizio Bacchetta, Sonia Morin, Maurizio Tremolada, Giulia Spinolo, Benjamin A. Bonner
Publikováno v:
MRS Proceedings. 767
The development of a direct polish process for STI CMP on 200mm wafers using highselectivity slurry (HSS) has been achieved for production of 0.13μm technology microelectronic devices. The new process has improved on-wafer performance compared to st
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3ac3ddfed66ce4daa03d7231e36ae5c2
https://doi.org/10.1557/proc-767-f5.10
https://doi.org/10.1557/proc-767-f5.10
Conference
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.