Zobrazeno 1 - 1
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pro vyhledávání: '"Amy V. Kauppila"'
Publikováno v:
IEEE Transactions on Nuclear Science. 59:886-892
This work postulates a mechanism, upset reversal, and analyzes the impact of process variations on the mechanism. Process variations are shown to affect the onset of upset reversal for a 65 nm flip-flop.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eee40e49fa193bf8fc962dff387bf154
https://doi.org/10.1109/tns.2012.2196448
https://doi.org/10.1109/tns.2012.2196448
