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pro vyhledávání: '"Amy L. Wilkerson"'
Publikováno v:
Journal of colloid and interface science. 249(1)
We employ a direct method, time-of-flight secondary ion mass spectroscopy (ToF-SIMS), to determine experimentally the chemical compositions of the wetted and dewetted regions of an uncured epoxy thin film. Determining the composition of the dewetted